Lenovo ThinkServer RD330 MegaRAID SAS Software User Guide - Page 379
Background Initialization BGI Aborted Due to Ownership
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MegaRAID SAS Software User Guide Appendix A: Events and Messages | Event Messages Table 135: Event Messages (Continued) Number Type 0x00bd Information 0x00be Information 0x00bf 0x00c0 0x00c1 0x00c2 0x00c3 0x00c4 0x00c5 0x00c6 0x00c7 Information Information Information Information Warning Warning Fatal Information Information 0x00c8 0x00c9 Critical Warning 0x00ca Critical 0x00cb Critical 0x00cc 0x00cd 0x00ce 0x00cf 0x00d0 0x00d1 0x00d2 0x00d3 0x00d4 0x00d5 0x00d6 0x00d7 0x00d8 Critical Information Critical Information Information Information Information Critical Information Information Critical Information Critical 0x00d9 0x00da 0x00db 0x00dc 0x00dd Information Information Information Information Warning Event Text SAS/SATA mixing not supported in enclosure; Drive %s disabled Enclosure (SES) hotplug on %s was detected, but is not supported Clustering enabled Clustering disabled Drive too small to be used for auto-rebuild on %s BBU enabled; changing WT virtual drives to WB BBU disabled; changing WB virtual drives to WT Bad block table on drive %s is 80% full Bad block table on drive %s is full; unable to log block %lx Consistency Check Aborted due to ownership loss on %s Background Initialization (BGI) Aborted Due to Ownership Loss on %s Battery/charger problems detected; SOH Bad Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); warning threshold exceeded Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); critical threshold exceeded Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); further reporting disabled Enclosure %s Power supply %d switched off Enclosure %s Power supply %d switched on Enclosure %s Power supply %d cable removed Enclosure %s Power supply %d cable inserted Enclosure %s Fan %d returned to normal BBU Retention test was initiated on previous boot BBU Retention test passed BBU Retention test failed! NVRAM Retention test was initiated on previous boot NVRAM Retention test passed NVRAM Retention test failed! %s test completed %d passes successfully %s test FAILED on %d pass. Fail data: errorOffset=%x goodData=%x badData=%x Self check diagnostics completed Foreign Configuration detected Foreign Configuration imported Foreign Configuration cleared NVRAM is corrupt; reinitializing Page 379