Lenovo ThinkServer RD330 MegaRAID SAS Software User Guide - Page 379

Background Initialization BGI Aborted Due to Ownership

Page 379 highlights

MegaRAID SAS Software User Guide Appendix A: Events and Messages | Event Messages Table 135: Event Messages (Continued) Number Type 0x00bd Information 0x00be Information 0x00bf 0x00c0 0x00c1 0x00c2 0x00c3 0x00c4 0x00c5 0x00c6 0x00c7 Information Information Information Information Warning Warning Fatal Information Information 0x00c8 0x00c9 Critical Warning 0x00ca Critical 0x00cb Critical 0x00cc 0x00cd 0x00ce 0x00cf 0x00d0 0x00d1 0x00d2 0x00d3 0x00d4 0x00d5 0x00d6 0x00d7 0x00d8 Critical Information Critical Information Information Information Information Critical Information Information Critical Information Critical 0x00d9 0x00da 0x00db 0x00dc 0x00dd Information Information Information Information Warning Event Text SAS/SATA mixing not supported in enclosure; Drive %s disabled Enclosure (SES) hotplug on %s was detected, but is not supported Clustering enabled Clustering disabled Drive too small to be used for auto-rebuild on %s BBU enabled; changing WT virtual drives to WB BBU disabled; changing WB virtual drives to WT Bad block table on drive %s is 80% full Bad block table on drive %s is full; unable to log block %lx Consistency Check Aborted due to ownership loss on %s Background Initialization (BGI) Aborted Due to Ownership Loss on %s Battery/charger problems detected; SOH Bad Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); warning threshold exceeded Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); critical threshold exceeded Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); further reporting disabled Enclosure %s Power supply %d switched off Enclosure %s Power supply %d switched on Enclosure %s Power supply %d cable removed Enclosure %s Power supply %d cable inserted Enclosure %s Fan %d returned to normal BBU Retention test was initiated on previous boot BBU Retention test passed BBU Retention test failed! NVRAM Retention test was initiated on previous boot NVRAM Retention test passed NVRAM Retention test failed! %s test completed %d passes successfully %s test FAILED on %d pass. Fail data: errorOffset=%x goodData=%x badData=%x Self check diagnostics completed Foreign Configuration detected Foreign Configuration imported Foreign Configuration cleared NVRAM is corrupt; reinitializing Page 379

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Page 379
MegaRAID SAS Software User Guide
Appendix A: Events and Messages
|
Event Messages
0x00bd
Information
SAS/SATA mixing not supported in enclosure; Drive %s
disabled
0x00be
Information
Enclosure (SES) hotplug on %s was detected, but is not
supported
0x00bf
Information
Clustering enabled
0x00c0
Information
Clustering disabled
0x00c1
Information
Drive too small to be used for auto-rebuild on %s
0x00c2
Information
BBU enabled; changing WT virtual drives to WB
0x00c3
Warning
BBU disabled; changing WB virtual drives to WT
0x00c4
Warning
Bad block table on drive %s is 80% full
0x00c5
Fatal
Bad block table on drive %s is full; unable to log block %lx
0x00c6
Information
Consistency Check Aborted due to ownership loss on %s
0x00c7
Information
Background Initialization (BGI) Aborted Due to Ownership
Loss on %s
0x00c8
Critical
Battery/charger problems detected; SOH Bad
0x00c9
Warning
Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); warning
threshold exceeded
0x00ca
Critical
Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); critical
threshold exceeded
0x00cb
Critical
Single-bit ECC error: ECAR=%x, ELOG=%x, (%s); further
reporting disabled
0x00cc
Critical
Enclosure %s Power supply %d switched off
0x00cd
Information
Enclosure %s Power supply %d switched on
0x00ce
Critical
Enclosure %s Power supply %d cable removed
0x00cf
Information
Enclosure %s Power supply %d cable inserted
0x00d0
Information
Enclosure %s Fan %d returned to normal
0x00d1
Information
BBU Retention test was initiated on previous boot
0x00d2
Information
BBU Retention test passed
0x00d3
Critical
BBU Retention test failed!
0x00d4
Information
NVRAM Retention test was initiated on previous boot
0x00d5
Information
NVRAM Retention test passed
0x00d6
Critical
NVRAM Retention test failed!
0x00d7
Information
%s test completed %d passes successfully
0x00d8
Critical
%s test FAILED on %d pass. Fail data: errorOffset=%x
goodData=%x badData=%x
0x00d9
Information
Self check diagnostics completed
0x00da
Information
Foreign Configuration detected
0x00db
Information
Foreign Configuration imported
0x00dc
Information
Foreign Configuration cleared
0x00dd
Warning
NVRAM is corrupt; reinitializing
Table 135: Event Messages (Continued)
Number
Type
Event Text