Toshiba Satellite A60 Maintenance Manual - Page 103
Memory Test, Diagnostic Programs, Pattern Size, Percent, Time Limith, Subtest 03, Extended Pattern
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3.6 Memory Test 3 Diagnostic Programs test coverage would be based on the setting and the value in 'Percent (%) mentioned at below. Pattern Size: Choose the pattern size - BYTE, WORD, DWORD or ALL. Percent (%): Choose the percentage of the defined range of the memory to be tested. Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested. Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested. 1. Bit Stuck High Test Data pattern: Every bit is '1' (Each bit is high) 2. Bit Stuck Low Test Data pattern: Every bit is '0'(Each bit is low); 3. Checker Board Test Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 (0xA); 4. CAS Line Test Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 1111(0xF); 5. Incremental Test Data pattern: A series of increasing data from 0 by adding 1 each time; 6. Decrement Test Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by subtracting 1 each time; 7. Incremental / Decrement Test Data Pattern is a series of data whose low byte is increasing data from 0x00 and high byte is decreasing data from 0xFF. Subtest 03 Extended Pattern Satellite A60/ Pro A60 Maintenance Manual 35