Hitachi IC25N040ATMR04-0 Specifications - Page 184
Self-test log data structure
UPC - 407061052632
View all Hitachi IC25N040ATMR04-0 manuals
Add to My Manuals
Save this manual to your list of manuals |
Page 184 highlights
13.38.5 Self-test log data structure The following defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these data structures follow the ATA/ATAPI-5 specifications for byte ordering. Table 120: Self-test log data structure Description Data structure revision Self-test number Self-test execution status Life time power on hours Self-test failure check point LBA of first failure Vendor specific ... Vendor specific Self-test log pointer Reserved Data structure checksum Byte Offset 2 00h 1 n*18h+02h 1 n*18h+03h 2 n*18h+04h 1 n*18h+06h 4 n*18h+07h 15 n*18h+08h 2 1FAh 1 1FCh 2 1FDh 1 1FFh 512 Note: N is 0 through 20 The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through 21. Travelstar 80GN Hard Disk Drive Specification 174