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Seagate ST9900805SS Savvio 10K.1 SAS Product Manual - Page 27

Drive Self Test DST, 2.6.1, DST failure definition, 2.6.2, Implementation, Table 11, Temperature Log

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can be used to set this trip point. The default value for this drive is 65°C, however, you can set it to any value in the range of 0 to 65°C. If you specify a temperature greater than 65°C in this field, the temperature is rounded down to 65°C. A sense code is sent to the host to indicate the rounding of the parameter field. Table 11: Temperature Log Page (0Dh) Parameter Code 0000h 0001h Description Primary Temperature Reference Temperature 5.2.6 Drive Self Test (DST) Drive Self Test (DST) is a technology designed to recognize drive fault conditions that qualify the drive as a failed unit. DST validates the functionality of the drive at a system level. There are two test coverage options implemented in DST: 1. Extended test 2. Short text The most thorough option is the extended test that performs various tests on the drive and scans every logical block address (LBA) of the drive. The short test is time-restricted and limited in length-it does not scan the entire media surface, but does some fundamental tests and scans portions of the media. If DST encounters an error during either of these tests, it reports a fault condition. If the drive fails the test, remove it from service and return it to Seagate for service. 5.2.6.1 DST failure definition The drive will present a "diagnostic failed" condition through the self-tests results value of the diagnostic log page if a functional failure is encountered during DST. The channel and servo parameters are not modified to test the drive more stringently, and the number of retries are not reduced. All retries and recovery processes are enabled during the test. If data is recoverable, no failure condition will be reported regardless of the number of retries required to recover the data. The following conditions are considered DST failure conditions: • Seek error after retries are exhausted • Track-follow error after retries are exhausted • Read error after retries are exhausted • Write error after retries are exhausted Recovered errors will not be reported as diagnostic failures. 5.2.6.2 Implementation This section provides all of the information necessary to implement the DST function on this drive. Savvio SAS Product Manual, Rev. D 21

Section	Page
1.0 Scope	7
2.0 Applicable standards and reference documentation	9
2.1 Standards	9
2.1.1 Electromagnetic compatibility	9
2.1.1.1 Electromagnetic susceptibility	9
2.1.2 Electromagnetic compliance	10
2.2 Reference documents	11
3.0 General description	13
3.1 Standard features	14
3.2 Media description	14
3.3 Performance	14
3.4 Reliability	15
3.5 Formatted capacities	15
3.6 Programmable drive capacity	15
3.7 Factory-installed accessories	15
3.8 Factory-installed options	16
3.9 User-installed accessories	16
4.0 Performance characteristics	17
4.1 Internal drive characteristics	17
4.2 Seek performance characteristics	17
4.2.1 Access time	17
4.2.2 Format command execution time for 512-byte sectors (minutes)	18
4.2.3 General performance characteristics	18
4.3 Start/stop time	19
4.4 Prefetch/multi-segmented cache control	19
4.5 Cache operation	19
4.5.1 Caching write data	20
4.5.2 Prefetch operation	21
4.5.3 Optimizing cache performance for desktop and server applications	21
5.0 Reliability specifications	23
5.1 Error rates	23
5.1.1 Recoverable Errors	23
5.1.2 Unrecoverable Errors	23
5.1.3 Seek errors	24
5.1.4 Interface errors	24
5.2 Reliability and service	24
5.2.1 Mean time between failure	24
5.2.2 Preventive maintenance	24
5.2.3 Hot plugging the drive	25
5.2.4 S.M.A.R.T.	25
5.2.5 Thermal monitor	26
5.2.6 Drive Self Test (DST)	27
5.2.6.1 DST failure definition	27
5.2.6.2 Implementation	27
5.2.6.2.1 State of the drive prior to testing	28
5.2.6.2.2 Invoking DST	28
5.2.6.2.3 Short and extended tests	28
5.2.6.2.4 Log page entries	29
5.2.6.2.5 Abort	29
5.2.7 Product warranty	29
6.0 Physical/electrical specifications	31
6.1 AC power requirements	31
6.2 DC power requirements	31
6.2.1 Conducted noise immunity	33
6.2.2 Power sequencing	33
6.2.3 Current profiles	33
6.3 Power dissipation	36
6.4 Environmental limits	38
6.4.1 Temperature	38
6.4.2 Relative humidity	38
6.4.3 Effective altitude (sea level)	39
6.4.4 Shock and vibration	39
6.4.4.1 Shock	39
6.4.4.2 Vibration	41
6.4.5 Air cleanliness	41
6.4.6 Corrosive environment	41
6.4.7 Acoustics	42
6.4.8 Electromagnetic susceptibility	42
6.5 Mechanical specifications	43
7.0 Defect and error management	45
7.1 Drive internal defects/errors	45
7.2 Drive error recovery procedures	45
7.3 SAS system errors	46
8.0 Installation	47
8.1 Drive orientation	47
8.2 Cooling	48
8.3 Drive mounting	49
8.4 Grounding	49
9.0 Interface requirements	51
9.1 SAS features	51
9.1.1 task management functions	51
9.1.2 task management responses	51
9.2 Dual port support	52
9.3 SCSI commands supported	53
9.3.1 Inquiry data	57
9.3.2 Mode Sense data	57
9.4 Miscellaneous operating features and conditions	61
9.4.1 SAS physical interface	62
9.4.2 Physical characteristics	65
9.4.3 Connector requirements	65
9.4.4 Electrical description	65
9.4.5 Pin descriptions	65
9.4.6 SAS transmitters and receivers	66
9.4.7 Power	67
9.5 Signal characteristics	67
9.5.1 Ready LED Out	67
9.5.2 Differential signals	67
9.5.2.1 Eye masks	68
9.5.2.1.1 Eye masks overview	68
9.5.2.1.2 Receive eye mask	68
9.5.2.1.3 Jitter tolerance masks	69
9.5.2.2 Transmitter signal characteristics	71
9.5.2.3 Receiver signal characteristics	72
9.5.2.3.1 Jitter	72
9.5.2.3.2 Receiver jitter tolerance	73
9.5.2.3.3 Compliant jitter test pattern (CJTPAT)	73
9.5.2.3.4 Impedance specifications	73
9.5.2.4 Electrical TxRx connections	74
9.5.2.4.1 Transmitter characteristics	74
9.5.2.5 Receiver characteristics	77
10.0 Seagate Technology support services	79
Numerics	81
A	81
B	81
C	81
D	81
E	81
F	82
G	82
H	82
I	82
J	82
L	82
M	82
N	83
O	83
P	83
Q	83
R	83
S	83
T	84
U	84
V	84
W	84

Match case Limit results 1 per page

Savvio SAS Product Manual, Rev. D

can be used to set this trip point. The default value for this drive is 65°C, however, you can set it to any value in

the range of 0 to 65°C. If you specify a temperature greater than 65°C in this field, the temperature is rounded

down to 65°C. A sense code is sent to the host to indicate the rounding of the parameter field.

5.2.6

Drive Self Test (DST)

Drive Self Test (DST) is a technology designed to recognize drive fault conditions that qualify the drive as a

failed unit. DST validates the functionality of the drive at a system level.

There are two test coverage options implemented in DST:

Extended test

Short text

The most thorough option is the extended test that performs various tests on the drive and scans every logical

block address (LBA) of the drive. The short test is time-restricted and limited in length—it does not scan the

entire media surface, but does some fundamental tests and scans portions of the media.

If DST encounters an error during either of these tests, it reports a fault condition. If the drive fails the test,

remove it from service and return it to Seagate for service.

5.2.6.1

DST failure definition

The drive will present a “diagnostic failed” condition through the self-tests results value of the diagnostic log

page if a functional failure is encountered during DST. The channel and servo parameters are not modified to

test the drive more stringently, and the number of retries are not reduced. All retries and recovery processes

are enabled during the test. If data is recoverable, no failure condition will be reported regardless of the number

of retries required to recover the data.

The following conditions are considered DST failure conditions:

•

Seek error after retries are exhausted

•

Track-follow error after retries are exhausted

•

Read error after retries are exhausted

•

Write error after retries are exhausted

Recovered errors will not be reported as diagnostic failures.

5.2.6.2

Implementation

This section provides all of the information necessary to implement the DST function on this drive.

Table 11:

Temperature Log Page (0Dh)

Parameter Code

Description

0000h

Primary Temperature

0001h

Reference Temperature