Toshiba Satellite Pro U300 Maintenance Manual - Page 151
Bit Shift Pattern Test, Working Data Test
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Test Program for Field. Subtest 04 Subtest 05 Subtest 06 Subtest 07 Subtest 08 Bit Shift Pattern Test This subtest reads the contents of cache memory and saves it into RAM. The subtest then writes the bit shift data patterns (1 bit shifted every 4 bytes), reads the new data and compares the result with the original data. The original cache memory content is then restored to the cache memory. Write Disturb Test (We can't support this time) This subtest reads the contents of cache memory and saves it into RAM. The subtest then writes the "write disturb data," reads the new data and compares the result with the original data. The original cache memory content is then restored to the cache memory. Checker Board Test This subtest reads the contents of cache memory and saves it into RAM. The subtest then writes the "checker board data," (data which is inverted front/back and left/right) reads the new data and compares the result with the original data. The original cache memory content is then restored to the cache memory. Marching Test This subtest reads the contents of cache memory and saves it into RAM. The subtest then writes the "marching data," (00H through 01H and 01H through 00H) reads the new data and compares the result with the original data. The original cache memory content is then restored to the cache memory. Working Data Test This subtest reads the contents of cache memory and saves it into RAM. The subtest then writes the "working data," reads the new data and compares the result with the original data. The original cache memory content is then restored to the cache memory. Satellite U300 and Satellite Pro U300 Tests and Diagnostics Manual 47