Hitachi 7K100 Hard Drive Specifications - Page 143
Self-test log data structure revision number, 15.3.2, Self-test descriptor index, 15.3.3,
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The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in 11.42.6, "Self-test log data structure" on page0203, shall also be included in the Extended SMART self-test log with all 48-bit entries. Description Self-test log data structure revision number Reserved Self-test descriptor index (7:0) Self-test descriptor index (15:8) Descriptor entry 1 Descriptor entry 2 ... Descriptor entry 18 Vendor specific Reserved Data structure checksum Bytes 1 1 1 1 26 25 Offset 00h 01h 02h 03h 04h 1Eh 26 1D8h 2 1F2h 11 1F4h 1 1FFh 512 These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros. 13.15.3.1 Self-test log data structure revision number The value of this revision number shall be 01h. 13.15.3.2 Self-test descriptor index This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values for the Self-test descriptor index are 0 to 18. 13.15.3.3 Extended Self-test log descriptor entry The content of the self-test descriptor entry is shown below. Description Self-test number Self-test execution status Power-on life timestamp in hours Self-test failure check point Failing LBA (7:0) Failing LBA (15:8) Failing LBA (23:16) Failing LBA (31:24) Failing LBA (39:32) Failing LBA (47:40) Vendor specific Bytes 1 1 2 1 1 1 1 1 1 1 15 26 Offset 00h 01h 02h 04h 05h 06h 07h 08h 09h 0AH 0BH Travelstar 7K100 Hard Disk Drive Specification 129
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