Sony MDS-JE470 Service Manual - Page 21

SELECTING THE TEST MODE, Display, Details, Group, Check, Service - error c13

Page 21 highlights

MDS-JE470 4-5. SELECTING THE TEST MODE There are 26 types of test modes as shown below. The groups can be switched by rotating the l AMS L knob. After selecting the group to be used, press the YES button. After setting a certain group, rotating the l AMS L knob switches between these modes. Refer to "Group" in the table for details selected. All adjustments and checks during servicing can be performed in the test mode in the Service group. NOTE: Do not use the test mode in the [Develop] group. If used, the unit may not operate normally. If the [Develop] group is set accidentally, press the MENU/NO button immediately to exit the [Develop] group. Display No. Details AUTO CHECK Err Display TEMP ADJUS LDPWR ADJUS Iop Write Iop NV Save EF MO ADJUS EF CD ADJUS FBIAS ADJUS AG Set (MO) AG Set (CD) TEMP CHECK LDPWR CHECK EF MO CHECK EF CD CHECK FBIAS CHECK ScurveCHECK VERIFYMODE DETRK CHECK 0920 CHECK Iop Read Iop Compare ADJ CLEAR INFORMATION CPLAY1MODE CREC 1MODE C01 Automatic self-diagnosis C02 Error history display, clear C03 Temperature compensation offset adjustment C04 Laser power adjustment C05 Iop data writing C06 Writes current Iop value in read nonvolatile memory using microprocessor C07 Traverse (MO) adjustment C08 Traverse (CD) adjustment C09 Focus bias adjustment C10 Focus, tracking gain adjustment (MO) C11 Focus, tracking gain adjustment (CD) C12 Temperature compensation offset check C13 Laser power check C14 Traverse (MO) check C15 Traverse (CD) check C16 Focus bias check C17 S-curve check C18 Nonvolatile memory check C19 Detrack check C25 Most circumference check C26 Iop data display C27 Comparison with initial Iop value written in nonvolatile memory C28 Initialization of nonvolatile memory for adjustment values C31 Display of microprocessor version, etc. C34 Continuous playback mode C35 Continuous recording mode Mark Group Check Service • For details of each adjustment mode, refer to "5. Electrical Adjustments". For details of "Err Display", refer to "Self-Diagnosis Function" on page 2. • If a different mode has been selected by mistake, press the MENU/NO button to exit that mode. • Modes with (X) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set acciden- tally, press the MENU/NO button to exit the mode immediately. 21

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21
MDS-JE470
Display
AUTO CHECK
Err Display
TEMP ADJUS
LDPWR ADJUS
Iop Write
Iop NV Save
EF MO ADJUS
EF CD ADJUS
FBIAS ADJUS
AG Set (MO)
AG Set (CD)
TEMP CHECK
LDPWR CHECK
EF MO CHECK
EF CD CHECK
FBIAS CHECK
ScurveCHECK
VERIFYMODE
DETRK CHECK
0920 CHECK
Iop Read
Iop Compare
ADJ CLEAR
INFORMATION
CPLAY1MODE
CREC 1MODE
Details
Automatic self-diagnosis
Error history display, clear
Temperature compensation offset adjustment
Laser power adjustment
Iop data writing
Writes current Iop value in read nonvolatile memory using microprocessor
Traverse (MO) adjustment
Traverse (CD) adjustment
Focus bias adjustment
Focus, tracking gain adjustment (MO)
Focus, tracking gain adjustment (CD)
Temperature compensation offset check
Laser power check
Traverse (MO) check
Traverse (CD) check
Focus bias check
S-curve check
Nonvolatile memory check
Detrack check
Most circumference check
Iop data display
Comparison with initial Iop value written in nonvolatile memory
Initialization of nonvolatile memory for adjustment values
Display of microprocessor version, etc.
Continuous playback mode
Continuous recording mode
4-5. SELECTING THE TEST MODE
There are 2
6
types of test modes as shown below. The groups can be switched by rotating the
l
AMS
L
knob. After selecting the
group to be used, press the
YES
button. After setting a certain group, rotating the
l
AMS
L
knob switches between these modes.
Refer to “Group” in the table for details selected.
All adjustments and checks during servicing can be performed in the test mode in the Service group.
For details of each adjustment mode, refer to “5. Electrical Adjustments”.
For details of “Err Display”, refer to “Self-Diagnosis Function” on page 2.
If a different mode has been selected by mistake, press the
MENU/NO
button to exit that mode.
Modes with (
X
) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set acciden-
tally, press the
MENU/NO
button to exit the mode immediately.
No.
C01
C02
C03
C04
C05
C06
C07
C08
C09
C10
C11
C12
C13
C14
C15
C16
C17
C18
C19
C25
C26
C27
C28
C31
C34
C35
Mark
Group
Check
Service
NOTE:
Do not use the test mode in the [Develop] group.
If used, the unit may not operate normally.
If the [Develop] group is set accidentally, press the
MENU/NO
button immediately to exit the [Develop] group.