Lexmark T522 Service Manual - Page 145
ROM Memory Test, Parallel Wrap Test, Serial Wrap Test
UPC - 734646620642
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4520-xxx ROM Memory Test The ROM Memory Test is used to check the validity of the controller board code and fonts. To run the ROM Memory Test: 1. Select ROM Memory Test from the menu. P and F represent the same numbers for DRAM. The power indicator blinks indicating the test is in process. The test runs continuously. 2. Press Return/Stop to exit the test. Each time the test finishes, the screen updates with the result. If the test passes, the Pass Count increases by 1, however if the test fails, one of the following messages displays for approximately three seconds: ROM Checksum Error or ROM Burst Read Error. Once the maximum pass count or fail count is reached, the test stops with the power indicator on solid. The results appear on the screen. Parallel Wrap Test This test is used with a wrap plug to check operation of the parallel port hardware. Each parallel signal is tested. To run the Parallel Wrap Test: 1. Disconnect the parallel interface cable and install the wrap plug (P/N 1319128). 2. Select the Parallel Wrap Test from the menu. The power indicator blinks indicating the test is in progress. The test runs continuously until canceled. Each time the test finishes, the screen updates. If the test passes, the Pass Count increases by 1, however if the test fails, a message displays for approximately three seconds. Once the maximum count is reached the test stops. The power indicator goes on solid and the final results display. 3. Press Return/Stop to exit the test. Serial Wrap Test This test is used to check the operation of the Serial Port Hardware using a wrap plug. Each signal is tested. Diagnostic Aids 3-13