HP StorageWorks 2/140 FW 08.01.00 McDATA Products in a SAN Environment Plannin - Page 122
Resilient single fabric, Redundant Fabrics
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Planning Considerations for Fibre Channel Topologies 3 Redundant Fabrics • Resilient single fabric - Directors and switches are connected to form a single fabric, but no single point of failure can cause the fabric to fail and segment into two or more smaller fabrics. • Nonresilient dual fabric - Half of the directors and switches are connected to form one fabric, and the remaining half are connected to form an identical but separate fabric. Servers and storage devices are connected to both fabrics. Each fabric contains at least one single point of failure (fabric element or ISL). All applications remain available, even if an entire fabric fails. • Resilient dual fabric - Half of the directors and switches are connected to form one fabric, and the remaining half are connected to form an identical but separate fabric. Servers and storage devices are connected to both fabrics. No single point of failure can cause either fabric to fail and segment. All applications remain available, even if an entire fabric fails and elements in the second fabric fail. A dual-fabric resilient topology is generally the best design to meet high-availability requirements. Another benefit of the design is the ability to proactively take one fabric offline for maintenance or upgrade without disrupting SAN operations. If high availability is important enough to require dual-connected servers and storage, a dual-fabric solution is generally preferable to a dual-connected single fabric. Dual fabrics maintain simplicity and reduce (by 50%) the size of fabric routing tables, name server tables, updates, and Class F management traffic. In addition, smaller fabrics are easier to analyze for performance, fault isolate, and maintain. Figure 3-16 illustrates simple redundant fabrics. Fabric "A" and fabric "B" are symmetrical, each containing one core director and four edge switches. All servers and storage devices are connected to both fabrics. Some dual-attached devices support active-active paths, while others support only active-passive paths. Active-active devices use either output path equally, and thus use both fabrics and double the device bandwidth. Active-passive devices use the passive path only when the active path fails. 3-38 McDATA Products in a SAN Environment - Planning Manual