Hitachi HTS541040G9AT00 Specifications - Page 146

Extended Self-test log sector - 0 replacement

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13.15.3.3 Device error count This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged. 13.15.4 Extended Self-test log sector The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in "Self-test log data structure" shall also be included in the Extended SMART self-test log with all 48-bit entries. Table 89: Extended Self-test log data structure Description Self-test log data structure number Reserved Self-test descriptor index (7:0) Self-test descriptor index (15:8) Descriptor entry 1 Descriptor entry 2 ... Descriptor entry 18 Vendor specific Reserved Data structure checksum revision Bytes Offset 1 00h 1 01h 1 02h 1 03h 26 04h 26 1Eh 26 1D8h 2 1F2h 11 1F4h 1 1FFh 512 These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros. 13.15.4.1 Self-test log data structure revision number The value of this revision number shall be 01h. 13.15.4.2 Self-test descriptor index The indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values for the self-test descriptor index are 0 to 18. 13.15.4.3 Extended self-test log descriptor entry The content of the self-test descriptor entry is shown below. Travelstar 5K100 Hard Disk Drive Specification 132

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Travelstar 5K100 Hard Disk Drive Specification
132
13.15.3.3
Device error count
This field shall contain the total number of errors attributable to the device that have been reported by the device
during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as
commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the
maximum value for this field is reached the count shall remain at the maximum value when additional errors are
encountered and logged.
13.15.4
Extended Self-test log sector
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in
the SMART self-test log, defined in "Self-test log data structure" shall also be included in the Extended SMART
self-test log with all 48-bit entries.
Table 89: Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that
replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry
2, etc. All unused self-test descriptors shall be filled with zeros.
13.15.4.1
Self-test log data structure revision number
The value of this revision number shall be 01h.
13.15.4.2
Self-test descriptor index
The indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid values for
the self-test descriptor index are 0 to 18.
13.15.4.3
Extended self-test log descriptor entry
The content of the self-test descriptor entry is shown below.
Description
Bytes
Offset
Self-test log data structure revision
number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h
Descriptor entry 1
26
04h
Descriptor entry 2
26
1Eh
...
Descriptor entry 18
26
1D8h
Vendor specific
2
1F2h
Reserved
11
1F4h
Data structure checksum
1
1FFh
512