Hitachi HTS541040G9AT00 Specifications - Page 197
Self-test log data structure, Selective self-test log data structure
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x1h x2h x3h x4h x5h-xAh xBh-xFh Sleep Standby Active/Idle S.M.A.R.T. Off-line or Self-test Reserved Vendor specific Note: The value of x is vendor specific 13.39.6 Self-test log data structure The following defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these data structures follow the ATA/ATAPI-6 specifications for byte ordering. Table 127: Self-test log data structure Description Data structure revision Self-test number Self-test execution status Life time power on hours Self-test failure check point LBA of first failure Vendor specific ... Vendor specific Self-test log pointer Reserved Data structure checksum Byte Offset 2 00h 1 n*18h+02h 1 n*18h+03h 2 n*18h+04h 1 n*18h+06h 4 n*18h+07h 15 n*18h+08h 2 1FAh 1 1FCh 2 1FDh 1 1FFh 512 Note: N is 0 through 20 The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there are descriptor(s), the value is 1 through 21. 13.39.7 Selective self-test log data structure The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering. Travelstar 5K100 Hard Disk Drive Specification 183