Hitachi 7K400 Specifications - Page 233
Selective self-test log data structure
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12.46.7 Selective self-test log data structure The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the ATA generation ATA major revision specifications for byte ordering. Table 165: Selective self-test log data structure Description Data structure revision Starting LBA for test span 1 Ending LBA for test span 1 Starting LBA for test span 2 Ending LBA for test span 2 Starting LBA for test span 3 Ending LBA for test span 3 Starting LBA for test span 4 Ending LBA for test span 4 Starting LBA for test span 5 Ending LBA for test span 5 Reserved Vendor specific Current LBA under test Current span under test Feature flags Vendor specific Selective self-test pending time Reserved Data structure checksum Bytes Offset 2 00h 8 02h 8 0Ah 8 12h 8 1Ah 8 22h 8 2Ah 8 32h 8 3Ah 8 42h 8 4Ah 256 52h 154 152h 8 1ECh 2 1F4h 2 1F6h 4 1F8h 2 1FCh 1 1FEh 1 1FFh 512 Read/Write R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W Reserved Vendor specific Read Read R/W Vendor specific R/W Reserved R/W 12.46.7.1 Feature flags The Feature flags define the features of Selective self-test to be executed. Bit 0 1 2 3 4 5-15 Description Vendor specific When set to one, perform off-line scan after selective test. Vendor specific When set to one, off-line scan after selective test is pending. When set to one, off-line scan after selective test is active. Reserved. Deskstar 7K400 Hard Disk Drive Specification 219
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