Lexmark C510 Service Manual - Page 222

5021-0XX Device tests Quick disk test This test performs a non-destructive read/write on one block per track on the disk. The test reads one block on each track, saves the data, and proceeds to write and read four test patterns to the bytes in the block. If the block is good, the saved data is written back to the disk. To run the quick disk test: 1. Select the Quick Disk Test from the device tests menu. The power indicator blinks while the test is in progress. 2. The "Quick Disk Test/Test Passed" message displays and the power indicator turns on solid. 3. The "Quick Disk Test/Test Failed" message displays and the power indicator turns on solid. 4. Press Go, Return, or Stop to return to the device test menu. Disk test/clean Warning: This test destroys all data on the disk and should not be attempted on a good disk. Normally this test will only be used when the disk contains bad data and is therefore unusable. Also note that this test may be extremely lengthy depending on the disk size. To run the disk test/clean test: 1. Select Disk Test/Clean from the device tests menu. "Files will be lost. Go/Stop?" message displays to warn the user that all contents on the disk will be lost. To exit the test immediately and return to the device tests menu, press Return or Stop. To continue with the test, press Go. If Go is selected, "Disk Test/Clean/Testing ... yyy%" message displays. The screen updates periodically indicating the percentage of test completed and the number of bad blocks found. The power indicator blinks during the test. Because of the nature of this operation, canceling of this test is not allowed. 3-14 Service Manual