Hitachi HDT725025VLA380 Specifications - Page 253

Error reporting

Page 253 highlights

of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering. Table 150: Selective self-test log data structure Description Data structure revision Starting LBA for test span 1 Ending LBA for test span 1 Starting LBA for test span 2 Ending LBA for test span 2 Starting LBA for test span 3 Ending LBA for test span 3 Starting LBA for test span 4 Ending LBA for test span 4 Starting LBA for test span 5 Ending LBA for test span 5 Reserved Vendor specific Current LBA under test Current span under test Feature flags Vendor specific Selective self-test pending time Reserved Data structure checksum Bytes 2 8 8 8 8 8 8 8 8 8 8 256 154 8 2 2 4 2 1 1 512 Offset 00h 02h 0Ah 12h 1Ah 22h 2Ah 32h 3Ah 42h 4Ah 52h 152h 1ECh 1F4h 1F6h 1F8h 1FCh 1FEh 1FFh Read/Write R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W R/W Reserved Vendor specific Read Read R/W Vendor specific R/W Reserved R/W 12.42.8 Error reporting The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device. Table 151: S.M.A.R.T. Error Codes Error condition A S.M.A.R.T. FUNCTION SET command was received by the device without the required key being loaded into the Cylinder High and Cylinder Low registers. A S.M.A.R.T. FUNCTION SET command was received by the device with a subcommand value in the Features Register that is either invalid or not supported by this device. Status Register 51h 51h Error Register 04h 04h Deskstar T7K500 Hard Disk Drive Specification 239

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Deskstar T7K500 Hard Disk Drive Specification
239
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
ATA/ATAPI-7 specifications for byte ordering.
Table 150: Selective self-test log data structure
12.42.8
Error reporting
The following table shows the values returned in the Status and Error Registers when specific error conditions are
encountered by a device.
Table 151: S.M.A.R.T. Error Codes
Error condition
Status Register
Error Register
A S.M.A.R.T. FUNCTION SET command was received by the
device without the required key being loaded into the
Cylinder High and Cylinder Low registers.
51h
04h
A S.M.A.R.T. FUNCTION SET command was received by the
device with a subcommand value in the Features Regis-
ter that is either invalid or not supported by this
device.
51h
04h
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12h
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W
Ending LBA for test span 5
8
4Ah
R/W
Reserved
256
52h
Reserved
Vendor specific
154
152h
Vendor specific
Current LBA under test
8
1ECh
Read
Current span under test
2
1F4h
Read
Feature flags
2
1F6h
R/W
Vendor specific
4
1F8h
Vendor specific
Selective self-test pending time
2
1FCh
R/W
Reserved
1
1FEh
Reserved
Data structure checksum
1
1FFh
R/W
512