Hitachi HTS541680J9SA00 Specifications - Page 101

Extended Self-test log sector

Get Hitachi HTS541680J9SA00 - Travelstar 80 GB Hard Drive PDF manuals and user guides View all Hitachi HTS541680J9SA00 manuals
Add to My Manuals
Save this manual to your list of manuals

Page 101 highlights

Travelstar 5K160 (SATA) Hard Disk Drive Specification Error register 1 01h Sector count register (7:0) (see Note) 1 02h Sector count register (15:8) (see Note) 1 03h Sector number register (7:0) 1 04h Sector number register (15:8) 1 05h Cylinder Low register (7:0) 1 06h Cylinder Low register (15:8) 1 07h Cylinder High register (7:0) 1 08h Cylinder High register (15:8) 1 09h Device register 1 0Ah Status register 1 0Bh Extended error data (vendor specific) 19 0Ch State 1 1Fh Life timestamp (hours) 2 20h 34 Note: bits (7:0) refer to the contents if the register is read with bit 7 of the Device Control register cleared to zero. Bits (15:8) refer to the contents if the register is read with bit 7 of the Device Control register set to one. Figure 55 Error data structure State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below. Value x0h x1h x2h x3h x4h x5h-xAh xBh-xFh State Unknown Sleep Standby Active/Idle SMART Off-line or Self-test Reserved Vendor specific Note: The value of x is vendor specific. 14.16.2.4 Device error count This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged. 14.16.3 Extended Self-test log sector Figure 56 defines the format of each of the sectors that comprise the Extended SMART self-test log. The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in "Self-test log data structure" shall also be included in the Extended SMART self-test log with all 48-bit entries. Description Self-test log data structure revision number Reserved Self-test descriptor index (7:0) Self-test descriptor index (15:8) Bytes Offset 1 00h 1 01h 1 02h 1 03h 101/167

  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • 10
  • 11
  • 12
  • 13
  • 14
  • 15
  • 16
  • 17
  • 18
  • 19
  • 20
  • 21
  • 22
  • 23
  • 24
  • 25
  • 26
  • 27
  • 28
  • 29
  • 30
  • 31
  • 32
  • 33
  • 34
  • 35
  • 36
  • 37
  • 38
  • 39
  • 40
  • 41
  • 42
  • 43
  • 44
  • 45
  • 46
  • 47
  • 48
  • 49
  • 50
  • 51
  • 52
  • 53
  • 54
  • 55
  • 56
  • 57
  • 58
  • 59
  • 60
  • 61
  • 62
  • 63
  • 64
  • 65
  • 66
  • 67
  • 68
  • 69
  • 70
  • 71
  • 72
  • 73
  • 74
  • 75
  • 76
  • 77
  • 78
  • 79
  • 80
  • 81
  • 82
  • 83
  • 84
  • 85
  • 86
  • 87
  • 88
  • 89
  • 90
  • 91
  • 92
  • 93
  • 94
  • 95
  • 96
  • 97
  • 98
  • 99
  • 100
  • 101
  • 102
  • 103
  • 104
  • 105
  • 106
  • 107
  • 108
  • 109
  • 110
  • 111
  • 112
  • 113
  • 114
  • 115
  • 116
  • 117
  • 118
  • 119
  • 120
  • 121
  • 122
  • 123
  • 124
  • 125
  • 126
  • 127
  • 128
  • 129
  • 130
  • 131
  • 132
  • 133
  • 134
  • 135
  • 136
  • 137
  • 138
  • 139
  • 140
  • 141
  • 142
  • 143
  • 144
  • 145
  • 146
  • 147
  • 148
  • 149
  • 150
  • 151
  • 152
  • 153
  • 154
  • 155
  • 156
  • 157
  • 158
  • 159
  • 160
  • 161
  • 162
  • 163
  • 164
  • 165
  • 166
  • 167
Travelstar 5K160 (SATA) Hard Disk Drive Specification
101/167
Error register
1
01h
Sector count register (7:0)
(see Note)
1
02h
Sector count register (15:8)
(see Note)
1
03h
Sector number register (7:0)
1
04h
Sector number register (15:8)
1
05h
Cylinder Low register (7:0)
1
06h
Cylinder Low register (15:8)
1
07h
Cylinder High register (7:0)
1
08h
Cylinder High register (15:8)
1
09h
Device register
1
0Ah
Status register
1
0Bh
Extended error data (vendor specific)
19
0Ch
State
1
1Fh
Life timestamp (hours)
2
20h
34
Note: bits (7:0) refer to the contents if the register is read with bit 7 of the Device Control register
cleared to zero. Bits (15:8) refer to the contents if the register is read with bit 7 of the Device Control
register set to one.
Figure 55 Error data structure
State shall contain a value indicating the state of the device when the command was issued to the
device or the reset occurred as described below.
Value
State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
SMART Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note:
The value of x is vendor specific
.
14.16.2.4
Device error count
This field shall contain the total number of errors attributable to the device that have been reported
by the device during the life of the device. This count shall not include errors attributed to the
receipt of faulty commands such as commands codes not implemented by the device or requests with
invalid parameters or invalid addresses. If the maximum value for this field is reached the count
shall remain at the maximum value when additional errors are encountered and logged.
14.16.3
Extended Self-test log sector
Figure 56 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit
entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be
included in the Extended SMART self-test log with all 48-bit entries.
Description
Bytes
Offset
Self-test log data structure revision number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h