Hitachi HTS541680J9SA00 Specifications - Page 145

Self-test log data structure, Selective self-test log data structure

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Travelstar 5K160 (SATA) Hard Disk Drive Specification 30 Figure 92 Error data structure State field contains a value indicating the device state when command was issued to the device. Value State x0h Unknown x1h Sleep x2h Standby x3h Active/Idle x4h S.M.A.R.T. Off-line or Self-test x5h-xAh Reserved xBh-xFh Vendor specific Note: The value of x is vendor specific. 14.40.6 Self-test log data structure The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering. Description Bytes Offset Data structure revision 2 00h Self-test number 1 n*18h+02h Self-test execution status 1 n*18h+03h Life time power on hours 2 n*18h+04h Self-test failure check point 1 n*18h+06h LBA of first failure 4 n*18h+07h Vendor specific 15 n*18h+0Bh ... Vendor specific 2 1FAh Self-test log pointer 1 1FCh Reserved 2 1FDh Data structure checksum 1 1FFh 512 Note: n is 0 through 20 Figure 93 Self-test log data structure The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new descriptor. Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is descriptor(s) the value is 1 through 21. 14.40.7 Selective self-test log data structure The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering. Description Bytes Offset Read/Write Data structure revision 2 00h R/W Starting LBA for test span 1 8 02h R/W Ending LBA for test span 1 8 0Ah R/W 145/167

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Travelstar 5K160 (SATA) Hard Disk Drive Specification
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30
Figure 92 Error data structure
State field contains a value indicating the device state when command was issued to the device.
Value
State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
S.M.A.R.T. Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note:
The value of x is vendor specific.
14.40.6
Self-test log data structure
The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields
shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering.
Description
Bytes Offset
Data structure revision
2
00h
Self-test number
1
n*18h+02h
Self-test execution status
1
n*18h+03h
Life time power on hours
2
n*18h+04h
Self-test failure check point
1
n*18h+06h
LBA of first failure
4
n*18h+07h
Vendor specific
15
n*18h+0Bh
...
Vendor specific
2
1FAh
Self-test log pointer
1
1FCh
Reserved
2
1FDh
Data structure checksum
1
1FFh
512
Note: n is 0 through 20
Figure 93 Self-test log data structure
The data structure contains the descriptor of Self-test that the device has performed. Each
descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21
descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new
descriptor.
Self-test log pointer points the most recent descriptor. When there is no descriptor the value
is 0. When there is descriptor(s) the value is 1 through 21.
14.40.7
Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log
allows the host to select the parameters for the self-test and to monitor the progress of the
self-test. The following table defines the contents of the Selective self-test log which is
512 bytes long. All multi-byte fields shown in these data structures follow the
specifications
for byte ordering.
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W