Fluke 28IIEX Fluke 28IIEx User Manual - Page 36
Diode Tests, capacitors before you do a diode test.
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28 II Ex Users Manual Diode Tests WCaution To prevent damage to the Product or to the equipment under test, disconnect circuit power and discharge all high-voltage capacitors before you do a diode test. Use the diode test to examine diodes, transistors, silicon controlled rectifiers (SCRs), and other semiconductor devices. This test sends current through a semiconductor junction, while it measures the junction's voltage drop. A good silicon junction drops between 0.5 V and 0.8 V. To do an out of circuit diode test, set up the Product as shown in Figure 7. For forward-bias measurements on a semiconductor component, put the red test lead on the component's positive terminal and put the black lead on the component's negative terminal. In a circuit, a good diode will cause a forward-bias measurement of 0.5 V to 0.8 V. A reverse-bias measurement can be different because of the resistance of other pathways between the probe tips. A short beep sounds if the diode is good (