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Hitachi HTS541010G9AT00 Specifications - Page 159

S.M.A.R.T. Execute Off-line Immediate subcommand D4h

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12.38.1.5 S.M.A.R.T. Execute Off-line Immediate (subcommand D4h) This subcommand causes the device to immediately initiate the set of activities that collect Attribute data in an offline mode (off-line routine) or execute a self-test routine in either captive or off-line mode. The LBA Low register shall be set to specify the operation to be executed. LBA Low 0 1 2 3 4 127 129 130 131 132 Operation to be executed Execute S.M.A.R.T. off-line data collection routine immediately Execute S.M.A.R.T. Short self-test routine immediately in off-line mode Execute S.M.A.R.T. Extended self-test routine immediately in off-line mode Reserved Execute SMART selective self-test routine immediately in off-line mode Abort off-line mode self-test routine Execute S.M.A.R.T. Short self-test routine immediately in captive mode Execute S.M.A.R.T. Extended self-test routine immediately in captive mode Reserved Execute SMART selective self-test routine immediately in captive mode Off-line mode: The device executes command completion before executing the specified routine. During execution of the routine the device will not set BSY nor clear DRDY. If the device is in the process of performing its routine and is interrupted by a new command from the host, the device will abort or suspend its routine and service the host within two seconds after receipt of the new command. After servicing the interrupting command, the device will resume its routine automatically or not start its routine depending on the interrupting command. Captive mode: When executing self-test in captive mode, the device sets BSY to one and executes the specified self-test routine after receipt of the command. At the end of the routine, the device sets the execution result in the Self-test execution status byte (see Table 101: "Device Attribute Data Structure" on page 151) and ATA registers and then executes the command completion. See definitions below. Status Error LBA Low LBA High Set ERR to one when the self-test has failed Set ABRT to one when the self-test has failed Set to F4h when the self-test has failed Set to 2Ch when the self-test has failed SMART Selective self-test routine When the value in the LBA Low register is 4 or 132, the Selective self-test routine shall be performed. This selftest routine shall include the initial tests performed by the Extended self-test routine plus a selectable read scan. The host shall not write the Selective self-test log while the execution of a Selective self-test command is in progress. The user may choose to do read scan only on specific areas of the media. To do this, user shall set the test spans desired in the Selective self-test log and set the flags in the Feature flags field of the Selective self-test log to indicate do not perform off-line scan. In this case, the test spans defined shall be read scanned in their entirety. The Selective self-test log is updated as the self-test proceeds indicating test progress. When all specified test spans have been completed, the test is terminated and the appropriate self-test execution status is reported in the SMART READ DATA response depending on the occurrence of errors. Table 118 shows an example of a Selective self test definition with three test spans defined. In this example, the test terminates when all three test spans have been scanned. Travelstar 5K100 (Serial ATA) Hard Disk Drive Specification 147

Section	Page
1.0 General	13
1.1 Introduction	13
1.2 References	13
1.3 Abbreviations	13
1.4 Caution	15
2.0 General features of the drive	17
3.0 Fixed-disk subsystem description	21
3.1 Control electronics	21
3.2 Head disk assembly	21
4.0 Drive characteristics	23
4.1 Formatted capacity	23
4.2 Data sheet	24
4.3 Drive organization	25
4.3.1 Drive format	25
4.3.2 Cylinder allocation	26
4.4 Performance characteristics	28
4.4.1 Command overhead	28
4.4.2 Mechanical positioning	28
4.4.3 Drive ready time	30
4.4.4 Operating modes	30
5.0 Data integrity	33
5.1 Data loss at power off	33
5.2 Write Cache	33
5.3 Equipment status	33
5.4 WRITE safety	34
5.5 Data buffer test	34
5.6 Error recovery	34
5.7 Automatic reallocation	34
5.8 ECC	35
6.0 Specification	37
6.1 Environment	37
6.1.1 Temperature and humidity	37
6.1.2 Corrosion test	38
6.2 Radiation noise	38
6.3 Conductive noise	39
6.4 Magnetic fields	39
6.5 DC power requirements	39
6.5.1 Power consumption efficiency	40
6.6 Reliability	41
6.6.1 Data integrity	41
6.6.2 Cable noise interference	41
6.6.3 Service life and usage condition	41
6.6.4 Preventive maintenance	41
6.6.5 Load/Unload	41
6.7 Emergency unload	42
6.7.1 Required power-off sequence	42
6.8 Mechanical specifications	43
6.8.1 Physical dimensions and weight	43
6.8.2 Mounting hole locations	43
6.8.3 Connector and jumper description	44
6.8.4 Drive mounting	44
6.8.5 Load/unload mechanism	44
6.9 Vibration and shock	44
6.9.1 Operating vibration	44
6.9.2 Nonoperating vibration	45
6.9.3 Operating shock	45
6.9.4 Nonoperating shock	46
6.10 Acoustics	46
6.10.1 Discrete tone penalty	47
6.11 Identification labels	47
6.12 Safety	47
6.12.1 UL and CSA approval	47
6.12.2 German safety mark	47
6.12.3 Flammability	47
6.12.4 Safe handling	48
6.12.5 Environment	48
6.12.6 Secondary circuit protection	48
6.13 Electromagnetic compatibility	48
6.13.1 CE mark	48
6.13.2 C-TICK mark	48
6.13.3 BSMI mark	49
6.14 Packaging	49
7.0 Electrical interface specification	51
7.1 Cabling	51
7.2 Interface connector	51
7.3 Signal definitions	52
8.0 General	55
8.1 Introduction	55
8.2 Deviations from standard	55
9.0 Registers	57
9.1 Register naming convention	57
9.2 Command Register	57
9.3 Device Control Register	58
9.4 Device Register	58
9.5 Error Register	59
9.6 Features Regsiter	59
9.7 LBA High Register	59
9.8 LBA Low Register	60
9.9 LBA Mid Register	60
9.10 Sector Count Register	60
9.11 Status Register	60
10.0 General operation descriptions	63
10.1 Reset response	63
10.2 Register initialization	64
10.3 Diagnostic and Reset considerations	64
10.4 Power-off considerations	65
10.4.1 Emergency unload	65
10.4.2 Required power-off sequence	65
10.5 Sector Addressing Mode	65
10.5.1 Logical CHS Addressing Mode	66
10.5.2 LBA Addressing Mode	66
10.6 Power management features	66
10.6.1 Power mode	67
10.6.2 Power management commands	67
10.6.3 Standby/Sleep command completion time	67
10.6.4 Standby timer	67
10.6.5 Status	67
10.6.6 Interface capability for power modes	68
10.6.7 Initial Power Mode at Power On	68
10.7 Advanced Power Management (ABLE-3) feature	68
10.7.1 Performance Idle Mode	69
10.7.2 Active Idle Mode	69
10.7.3 Low Power Idle Mode	69
10.7.4 Transition time	69
10.8 S.M.A.R.T. Function	69
10.8.1 Attributes	70
10.8.2 Attribute values	70
10.8.3 Attribute thresholds	70
10.8.4 Threshold exceeded condition	70
10.8.5 S.M.A.R.T. commands	70
10.8.6 S.M.A.R.T. operation with power management modes	70
10.9 Security Mode Feature Set	70
10.9.1 Security mode	71
10.9.2 Security level	71
10.9.3 Password	71
10.9.4 Master Password Revision Code	71
10.9.5 Command table	75
10.10 Protected Area Function	76
10.10.1 Example for operation (In LBA Mode)	76
10.10.2 Set Max security extension commands	77
10.11 Seek Overlap	78
10.12 Write Cache function	79
10.13 Reassign Function	79
10.13.1 Auto Reassign Function	80
10.14 48-bit Address Feature Set	81
10.15 Software Setting Preservation Feature Set	81
10.15.1 Preserved software settings	82
11.0 Command protocol	83
11.1 Data In commands	83
11.2 Data Out Commands	84
11.3 Non-data commands	85
11.4 DMA data in commands	85
12.0 Command descriptions	87
12.1 Check Power Mode (E5h/98h)	91
12.2 Device Configuration Overlay (B1h)	92
12.2.1 DEVICE CONFIGURATION RESTORE (subcommand C0h)	92
12.2.2 DEVICE CONFIGURATION FREEZE LOCK (subcommand C1h)	92
12.2.3 DEVICE CONFIGURATION IDENTIFY (subcommand C2h)	93
12.2.4 DEVICE CONFIGURATION SET (subcommand C3h)	93
12.3 Execute Device Diagnostic (90h)	96
12.4 Flush Cache (E7h)	97
12.5 Flush Cache EXT (EAh)	98
12.6 Format Track (50h: vendor specific)	99
12.7 Format Unit (F7h: vendor specific)	100
12.8 Identify Device (ECh)	101
12.9 Idle (E3h/97h)	111
12.10 Idle Immediate (E1h/95h)	112
12.11 Initialize Device Parameters (91h)	113
12.12 Read Buffer (E4h)	114
12.13 Read DMA (C8h/C9h)	115
12.14 Read DMA EXT (25h)	117
12.15 Read Log Ext (2Fh)	119
12.15.1 General purpose log Directory	120
12.15.2 Extended comprehensive SMART error log	121
12.15.3 Error Log version	121
12.15.4 Extended Self-test log sector	123
12.16 Read Long (22h/23h)	125
12.17 Read Multiple (C4h)	127
12.18 Read Multiple EXT (29h)	129
12.19 Read Native Max ADDRESS (F8h)	130
12.20 Read Native Max ADDRESS EXT (27h)	131
12.21 Read Sectors (20h/21h)	132
12.22 Read Sector(s) EXT (24h)	133
12.23 Read Verify Sectors (40h/41h)	135
12.24 Ready Verify Sector(s) EXT (42h)	137
12.25 Recalibrate (1xh)	139
12.26 Security Disable Password (F6h)	140
12.27 Security Erase Unit (F3h)	141
12.28 Security Freeze Lock (F5h)	143
12.29 Security Set Password (F1h)	144
12.30 Security Unlock (F2h)	146
12.31 Seek (7xh)	147
12.32 Sense Condition (F0h: vendor specific)	148
12.33 Set Features (EFh)	149
12.34 Set Max ADDRESS (F9h)	151
12.35 Set Max ADDRESS EXT (37h)	153
12.36 Set Multiple (C6h)	155
12.37 Sleep (E6h/99h)	156
12.38 S.M.A.R.T. Function Set (B0h)	157
12.38.1 S.M.A.R.T. Function Subcommands	158
12.38.2 Device Attribute Data Structure	163
12.38.3 Device Attribute Thresholds data structure	168
12.38.4 S.M.A.R.T Log Directory	169
12.38.5 S.M.A.R.T. error log sector	170
12.38.6 Self-test log data structure	172
12.38.7 Selective self-test log data structure	172
12.38.8 Error reporting	174
12.39 Standby (E2h/96h)	175
12.40 Standby Immediate (E0h/94h)	176
12.41 Write Buffer (E8h)	177
12.42 Write DMA (CAh/CBh)	178
12.43 Write DMA EXT (35h)	180
12.44 Write Log Ext (3Fh)	182
12.45 Write Long (32h/33h)	183
12.46 Write Multiple (C5h)	185
12.47 Write Multiple EXT (39h)	186
12.48 Write Sectors (30h/31h)	188
12.49 Write Sectors(s) EXT (34h)	190
12.50 Write Verify (3Ch: vendor specific)	191
13.0 Timings	193
14.0 Appendix	195
14.1 Commands Support Coverage	195
14.2 SET FEATURES Commands Support Coverage	197

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Travelstar 5K100 (Serial ATA) Hard Disk Drive Specification

147

12.38.1.5

S.M.A.R.T. Execute Off-line Immediate (subcommand D4h)

This subcommand causes the device to immediately initiate the set of activities that collect Attribute data in an off-

line mode (off-line routine) or execute a self-test routine in either captive or off-line mode. The LBA Low register

shall be set to specify the operation to be executed.

Off-line mode:

The device executes command completion before executing the specified routine. During execu-

tion of the routine the device will not set BSY nor clear DRDY. If the device is in the process of performing its rou-

tine and is interrupted by a new command from the host, the device will abort or suspend its routine and service the

host within two seconds after receipt of the new command. After servicing the interrupting command, the device

will resume its routine automatically or not start its routine depending on the interrupting command.

Captive mode:

When executing self-test in captive mode, the device sets BSY to one and executes the specified

self-test routine after receipt of the command. At the end of the routine, the device sets the execution result in the

Self-test execution status byte (see Table 101: “Device Attribute Data Structure” on page 151) and ATA registers

and then executes the command completion. See definitions below.

SMART Selective self-test routine

When the value in the LBA Low register is 4 or 132, the Selective self-test routine shall be performed. This self-

test routine shall include the initial tests performed by the Extended self-test routine plus a selectable read scan.

The host shall not write the Selective self-test log while the execution of a Selective self-test command is in

progress.

The user may choose to do read scan only on specific areas of the media. To do this, user shall set the test spans

desired in the Selective self-test log and set the flags in the Feature flags field of the Selective self-test log to indi-

cate do not perform off-line scan. In this case, the test spans defined shall be read scanned in their entirety. The

Selective self-test log is updated as the self-test proceeds indicating test progress. When all specified test spans

have been completed, the test is terminated and the appropriate self-test execution status is reported in the SMART

READ DATA response depending on the occurrence of errors. Table 118 shows an example of a Selective self test

definition with three test spans defined. In this example, the test terminates when all three test spans have been

scanned.

LBA Low

Operation to be executed

Execute S.M.A.R.T. off-line data collection routine immediately

Execute S.M.A.R.T. Short self-test routine immediately in off-line mode

Execute S.M.A.R.T. Extended self-test routine immediately in off-line mode

Reserved

Execute SMART selective self-test routine immediately in off-line mode

127

Abort off-line mode self-test routine

129

Execute S.M.A.R.T. Short self-test routine immediately in captive mode

130

Execute S.M.A.R.T. Extended self-test routine immediately in captive mode

131

Reserved

132

Execute SMART selective self-test routine immediately in captive mode

Status

Set ERR to one when the self-test has failed

Error

Set ABRT to one when the self-test has failed

LBA Low

Set to F4h when the self-test has failed

LBA High

Set to 2Ch when the self-test has failed