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Intel BX80571E5300 Data Sheet - Page 13

Electrical Specifications - motherboard

UPC - 735858204996

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Electrical Specifications 2 Electrical Specifications 2.1 2.2 2.2.1 2.2.2 This chapter describes the electrical characteristics of the processor interfaces and signals. DC electrical characteristics are provided. Power and Ground Lands The processor has VCC (power), VTT, and VSS (ground) inputs for on-chip power distribution. All power lands must be connected to VCC, while all VSS lands must be connected to a system ground plane. The processor VCC lands must be supplied the voltage determined by the Voltage IDentification (VID) lands. The signals denoted as VTT provide termination for the front side bus and power to the I/O buffers. A separate supply must be implemented for these lands, that meets the VTT specifications outlined in Table 4. Decoupling Guidelines Due to its large number of transistors and high internal clock speeds, the processor is capable of generating large current swings. This may cause voltages on power planes to sag below their minimum specified values if bulk decoupling is not adequate. Larger bulk storage (CBULK), such as electrolytic or aluminum-polymer capacitors, supply current during longer lasting changes in current demand by the component, such as coming out of an idle condition. Similarly, they act as a storage well for current when entering an idle condition from a running condition. The motherboard must be designed to ensure that the voltage provided to the processor remains within the specifications listed in Table 4. Failure to do so can result in timing violations or reduced lifetime of the component. VCC Decoupling VCC regulator solutions need to provide sufficient decoupling capacitance to satisfy the processor voltage specifications. This includes bulk capacitance with low effective series resistance (ESR) to keep the voltage rail within specifications during large swings in load current. In addition, ceramic decoupling capacitors are required to filter high frequency content generated by the front side bus and processor activity. Consult the Voltage Regulator-Down (VRD) 11.0 Processor Power Delivery Design Guidelines For Desktop LGA775 Socket for further information. Contact your Intel field representative for additional information. VTT Decoupling Decoupling must be provided on the motherboard. Decoupling solutions must be sized to meet the expected load. To ensure compliance with the specifications, various factors associated with the power delivery solution must be considered including regulator type, power plane and trace sizing, and component placement. A conservative decoupling solution would consist of a combination of low ESR bulk capacitors and high frequency ceramic capacitors. Datasheet 13

Section	Page
Intel® Pentium® Dual-Core Processor E5000D Series	1
Contents	3
Figures	5
Tables	6
Intel® Pentium® Dual-Core Processor E5000 Series Features	7
Revision History	8
1 Introduction	9
1.1 Terminology	9
1.1.1 Processor Terminology Definitions	10
1.2 References	11
Table 1. References	11
2 Electrical Specifications	13
2.1 Power and Ground Lands	13
2.2 Decoupling Guidelines	13
2.2.1 VCC Decoupling	13
2.2.2 VTT Decoupling	13
2.2.3 FSB Decoupling	14
2.3 Voltage Identification	14
Table 2. Voltage Identification Definition	15
2.4 Reserved, Unused, and TESTHI Signals	16
2.5 Power Segment Identifier (PSID)	16
2.6 Voltage and Current Specification	17
2.6.1 Absolute Maximum and Minimum Ratings	17
Table 3. Absolute Maximum and Minimum Ratings	17
2.6.2 DC Voltage and Current Specification	18
Table 4. Voltage and Current Specifications	18
Table 5. Processor VCC Static and Transient Tolerance	19
Figure 1. Processor VCC Static and Transient Tolerance	20
2.6.3 VCC Overshoot	20
Table 6. VCC Overshoot Specifications	20
Figure 2. VCC Overshoot Example Waveform	21
2.6.4 Die Voltage Validation	21
2.7 Signaling Specifications	21
2.7.1 FSB Signal Groups	22
Table 7. FSB Signal Groups	22
Table 8. Signal Characteristics	23
Table 9. Signal Reference Voltages	23
2.7.2 CMOS and Open Drain Signals	23
2.7.3 Processor DC Specifications	24
Table 10. GTL+ Signal Group DC Specifications	24
Table 11. Open Drain and TAP Output Signal Group DC Specifications	24
Table 12. CMOS Signal Group DC Specifications	25
2.7.3.1 Platform Environment Control Interface (PECI) DC Specifications	25
Table 13. PECI DC Electrical Limits	26
2.7.3.2 GTL+ Front Side Bus Specifications	26
Table 14. GTL+ Bus Voltage Definitions	27
2.8 Clock Specifications	27
2.8.1 Front Side Bus Clock (BCLK[1:0]) and Processor Clocking	27
Table 15. Core Frequency to FSB Multiplier Configuration	28
2.8.2 FSB Frequency Select Signals (BSEL[2:0])	28
Table 16. BSEL[2:0] Frequency Table for BCLK[1:0]	29
2.8.3 Phase Lock Loop (PLL) and Filter	29
2.8.4 BCLK[1:0] Specifications	29
Table 17. Front Side Bus Differential BCLK Specifications	29
Table 18. FSB Differential Clock Specifications (800 MHz FSB)	30
Figure 3. Differential Clock Waveform	30
Figure 4. Measurement Points for Differential Clock Waveforms	31
3 Package Mechanical Specifications	33
Figure 5. Processor Package Assembly Sketch	33
3.1 Package Mechanical Drawing	33
Figure 6. Processor Package Drawing Sheet 1 of 3	34
Figure 7. Processor Package Drawing Sheet 2 of 3	35
Figure 8. Processor Package Drawing Sheet 3 of 3	36
3.2 Processor Component Keep-Out Zones	37
3.3 Package Loading Specifications	37
Table 19. Processor Loading Specifications	37
3.4 Package Handling Guidelines	37
Table 20. Package Handling Guidelines	37
3.5 Package Insertion Specifications	38
3.6 Processor Mass Specification	38
3.7 Processor Materials	38
Table 21. Processor Materials	38
3.8 Processor Markings	38
Figure 9. Processor Top-Side Markings Example	38
3.9 Processor Land Coordinates	39
Figure 10. Processor Land Coordinates and Quadrants, Top View	39
4 Land Listing and Signal Descriptions	41
4.1 Processor Land Assignments	41
Figure 11. land-out Diagram (Top View - Left Side)	42
Figure 12. land-out Diagram (Top View - Right Side)	43
Table 22. Alphabetical Land Assignments	44
Table 23. Numerical Land Assignment	54
4.2 Alphabetical Signals Reference	64
Table 24. Signal Description (Sheet 10 of 10)	64
5 Thermal Specifications and Design Considerations	75
5.1 Processor Thermal Specifications	75
5.1.1 Thermal Specifications	75
Table 25. Processor Thermal Specifications	76
Table 26. Processor Thermal Profile	77
Figure 13. Processor Series Thermal Profile	77
5.1.2 Thermal Metrology	78
Figure 14. Case Temperature (TC) Measurement Location	78
5.2 Processor Thermal Features	78
5.2.1 Thermal Monitor	78
5.2.2 Thermal Monitor 2	79
Figure 15. Thermal Monitor 2 Frequency and Voltage Ordering	80
5.2.3 On-Demand Mode	80
5.2.4 PROCHOT# Signal	80
5.2.5 THERMTRIP# Signal	81
5.3 Platform Environment Control Interface (PECI)	81
5.3.1 Introduction	81
5.3.1.1 TCONTROL and TCC activation on PECI-Based Systems	82
Figure 16. Conceptual Fan Control Diagram on PECI-Based Platforms	82
5.3.2 PECI Specifications	82
5.3.2.1 PECI Device Address	82
5.3.2.2 PECI Command Support	82
5.3.2.3 PECI Fault Handling Requirements	83
5.3.2.4 PECI GetTemp0() Error Code Support	83
Table 27. GetTemp0() Error Codes	83
6 Features	85
6.1 Power-On Configuration Options	85
Table 28. Power-On Configuration Option Signals	85
6.2 Clock Control and Low Power States	85
Figure 17. Processor Low Power State Machine	86
6.2.1 Normal State	86
6.2.2 HALT and Extended HALT Powerdown States	86
6.2.2.1 HALT Powerdown State	86
6.2.2.2 Extended HALT Powerdown State	87
6.2.3 Stop Grant and Extended Stop Grant States	87
6.2.3.1 Stop-Grant State	87
6.2.3.2 Extended Stop Grant State	88
6.2.4 Extended HALT Snoop State, HALT Snoop State, Extended Stop Grant Snoop State, and Stop Grant Snoop State	88
6.2.4.1 HALT Snoop State, Stop Grant Snoop State	88
6.2.4.2 Extended HALT Snoop State, Extended Stop Grant Snoop State	88
6.2.5 Sleep State	88
6.2.6 Deep Sleep State	89
6.2.7 Deeper Sleep State	89
6.2.8 Enhanced Intel SpeedStep® Technology	90
6.3 Processor Power Status Indicator (PSI) Signal	90
7 Boxed Processor Specifications	91
7.1 Introduction	91
Figure 18. Mechanical Representation of the Boxed Processor	91
7.2 Mechanical Specifications	92
7.2.1 Boxed Processor Cooling Solution Dimensions	92
Figure 19. Space Requirements for the Boxed Processor (Side View)	92
Figure 20. Space Requirements for the Boxed Processor (Top View)	92
Figure 21. Overall View Space Requirements for the Boxed Processor	93
7.2.2 Boxed Processor Fan Heatsink Weight	93
7.2.3 Boxed Processor Retention Mechanism and Heatsink Attach Clip Assembly	93
7.3 Electrical Requirements	93
7.3.1 Fan Heatsink Power Supply	93
Figure 22. Boxed Processor Fan Heatsink Power Cable Connector Description	94
Table 29. Fan Heatsink Power and Signal Specifications	94
Figure 23. Baseboard Power Header Placement Relative to Processor Socket	95
7.4 Thermal Specifications	95
7.4.1 Boxed Processor Cooling Requirements	95
Figure 24. Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 1 view)	96
Figure 25. Boxed Processor Fan Heatsink Airspace Keepout Requirements (side 2 view)	96
7.4.2 Variable Speed Fan	97
Figure 26. Boxed Processor Fan Heatsink Set Points	97
Table 30. Fan Heatsink Power and Signal Specifications	98
8 Debug Tools Specifications	99
8.1 Logic Analyzer Interface (LAI)	99
8.1.1 Mechanical Considerations	99

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Datasheet

Electrical Specifications

This chapter describes the electrical characteristics of the processor interfaces and

signals. DC electrical characteristics are provided.

2.1

Power and Ground Lands

The processor has VCC (power), VTT, and VSS (ground) inputs for on-chip power

distribution. All power lands must be connected to V

, while all VSS lands must be

connected to a system ground plane. The processor VCC lands must be supplied the

voltage determined by the

oltage

entification (VID) lands.

The signals denoted as VTT provide termination for the front side bus and power to the

I/O buffers. A separate supply must be implemented for these lands, that meets the

specifications outlined in

Table 4

2.2

Decoupling Guidelines

Due to its large number of transistors and high internal clock speeds, the processor is

capable of generating large current swings. This may cause voltages on power planes

to sag below their minimum specified values if bulk decoupling is not adequate. Larger

bulk storage (C

BULK

), such as electrolytic or aluminum-polymer capacitors, supply

current during longer lasting changes in current demand by the component, such as

coming out of an idle condition. Similarly, they act as a storage well for current when

entering an idle condition from a running condition. The motherboard must be designed

to ensure that the voltage provided to the processor remains within the specifications

listed in

Table 4

. Failure to do so can result in timing violations or reduced lifetime of

the component.

2.2.1

Decoupling

regulator solutions need to provide sufficient decoupling capacitance to satisfy the

processor voltage specifications. This includes bulk capacitance with low effective series

resistance (ESR) to keep the voltage rail within specifications during large swings in

load current. In addition, ceramic decoupling capacitors are required to filter high

frequency content generated by the front side bus and processor activity. Consult the

Voltage Regulator-Down (VRD) 11.0 Processor Power Delivery Design Guidelines For

Desktop LGA775 Socket

for further information. Contact your Intel field representative

for additional information.

2.2.2

Decoupling

Decoupling must be provided on the motherboard. Decoupling solutions must be sized

to meet the expected load. To ensure compliance with the specifications, various

factors associated with the power delivery solution must be considered including

regulator type, power plane and trace sizing, and component placement. A

conservative decoupling solution would consist of a combination of low ESR bulk

capacitors and high frequency ceramic capacitors.