Hitachi 7K320 Specifications - Page 112

Extended Self-test log sector

Get Hitachi 7K320 - Travelstar Mobile Hard Drive PDF manuals and user guides
UPC - 890552647200
View all Hitachi 7K320 manuals
Add to My Manuals
Save this manual to your list of manuals

Page 112 highlights

7K320 (SATA) OEM Specification State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below. Value x0h x1h x2h x3h x4h x5h-xAh xBh-xFh State Unknown Sleep Standby Active/Idle SMART Off-line or Self-test Reserved Vendor specific Note: The value of x is vendor specific. 14.17.2.4 Device error count This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged. 14.17.3 Extended Self-test log sector The following table defines the format of each of the sectors that comprise the Extended SMART self-test log. The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in "Self-test log data structure" shall also be included in the Extended SMART self-test log with all 48-bit entries. Description Self-test log data structure revision number Reserved Self-test descriptor index (7:0) Self-test descriptor index (15:8) Descriptor entry 1 Descriptor entry 2 ... Descriptor entry 18 Vendor specific Reserved Data structure checksum Bytes Offset 1 00h 1 01h 1 02h 1 03h 26 04h 26 1Eh 26 1D8h 2 1F2h 11 1F4h 1 1FFh 512 Table 80 Extended Self-test log data structure These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros 14.17.3.1 Self-test log data structure revision number The value of this revision number shall be 01h. Page 112 of 176

  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • 10
  • 11
  • 12
  • 13
  • 14
  • 15
  • 16
  • 17
  • 18
  • 19
  • 20
  • 21
  • 22
  • 23
  • 24
  • 25
  • 26
  • 27
  • 28
  • 29
  • 30
  • 31
  • 32
  • 33
  • 34
  • 35
  • 36
  • 37
  • 38
  • 39
  • 40
  • 41
  • 42
  • 43
  • 44
  • 45
  • 46
  • 47
  • 48
  • 49
  • 50
  • 51
  • 52
  • 53
  • 54
  • 55
  • 56
  • 57
  • 58
  • 59
  • 60
  • 61
  • 62
  • 63
  • 64
  • 65
  • 66
  • 67
  • 68
  • 69
  • 70
  • 71
  • 72
  • 73
  • 74
  • 75
  • 76
  • 77
  • 78
  • 79
  • 80
  • 81
  • 82
  • 83
  • 84
  • 85
  • 86
  • 87
  • 88
  • 89
  • 90
  • 91
  • 92
  • 93
  • 94
  • 95
  • 96
  • 97
  • 98
  • 99
  • 100
  • 101
  • 102
  • 103
  • 104
  • 105
  • 106
  • 107
  • 108
  • 109
  • 110
  • 111
  • 112
  • 113
  • 114
  • 115
  • 116
  • 117
  • 118
  • 119
  • 120
  • 121
  • 122
  • 123
  • 124
  • 125
  • 126
  • 127
  • 128
  • 129
  • 130
  • 131
  • 132
  • 133
  • 134
  • 135
  • 136
  • 137
  • 138
  • 139
  • 140
  • 141
  • 142
  • 143
  • 144
  • 145
  • 146
  • 147
  • 148
  • 149
  • 150
  • 151
  • 152
  • 153
  • 154
  • 155
  • 156
  • 157
  • 158
  • 159
  • 160
  • 161
  • 162
  • 163
  • 164
  • 165
  • 166
  • 167
  • 168
  • 169
  • 170
  • 171
  • 172
  • 173
  • 174
  • 175
  • 176
7K320 (SATA) OEM Specification
Page 112 of 176
or count
State shall contain a value indicating the state of the device when the command was issued to the
device or the reset occurred as described below.
Value
State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
SMART Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Note:
The value of x is vendor specific
.
14.17.2.4
Device err
This field shall contain the total number of errors attributable to the device that have been reported
by the device during the life of the device. This count shall not include errors attributed to the
receipt of faulty commands such as commands codes not implemented by the device or requests with
invalid parameters or invalid addresses. If the maximum value for this field is reached the count
shall remain at the maximum value when additional errors are encountered and logged.
14.17.3
Extended Self-test log sector
The following table defines the format of each of the sectors that comprise the Extended SMART
self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit
entries contained in the SMART self-test log, defined in “Self-test log data structure” shall also be
included in the Extended SMART self-test log with all 48-bit entries.
Description
Bytes
Offset
Self-test log data structure revision number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h
Descriptor entry 1
26
04h
Descriptor entry 2
26
1Eh
...
Descriptor entry 18
26
1D8h
Vendor specific
2
1F2h
Reserved
11
1F4h
Data structure checksum
1
1FFh
512
Table 80 Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a
descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a
descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled
with zeros
14.17.3.1
Self-test log data structure revision number
The value of this revision number shall be 01h.