Hitachi 7K320 Specifications - Page 157
Self-test log data structure
![]() |
UPC - 890552647200
View all Hitachi 7K320 manuals
Add to My Manuals
Save this manual to your list of manuals |
Page 157 highlights
14.40.6 Self-test log data structure 7K320 (SATA) OEM Specification The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering. Description Bytes Offset Data structure revision 2 00h Self-test number 1 n*18h+02h Self-test execution status 1 n*18h+03h Life time power on hours 2 n*18h+04h Self-test failure check point 1 n*18h+06h LBA of first failure 4 n*18h+07h Vendor specific 15 n*18h+0Bh ... Vendor specific 2 1FAh Self-test log pointer 1 1FCh Reserved 2 1FDh Data structure checksum 1 1FFh 512 Note: n is 0 through 20 Table 123 Self-test log data structure The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with new descriptor. Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is descriptor(s) the value is 1 through 21. Page 157 of 176
![](/manual_guide/products/hitachi-7k320-specifications-e740aea/157.png)