Hitachi 7K320 Specifications - Page 150

7K320 (SATA) OEM Specification Attribute ID Numbers: Any non-zero value in the Attribute ID Number indicates an active attribute. The device supports following Attribute ID Numbers. Those marked with (*) indicate that corresponding Attribute Values can be either collected on-line or off-line. Those marked with (**) indicate that corresponding Attribute Values is only for Free-fall sensor supported model. ID Attribute Name 0 Indicates that this entry in the data structure is not used 1 Raw Read Error Rate (*) 2 Throughput Performance (*) 3 Spin Up Time 4 Start/Stop Count 5 Reallocated Sector Count 7 Seek Error Rate 8 Seek Time Performance (*) 9 Power-On Hours Count 10 Spin Retry Count 12 Device Power Cycle Count 160 Free-fall Sensor Self Test Result (**) 191 G Sense error rate 192 Power off retract count 193 Load/Unload cycle count 194 Device Temperature 196 Reallocation Event Count 197 Current Pending Sector Count 198 Off-Line Scan Uncorrectable Sector Count 199 Ultra DMA CRC Error Count 223 Load Retry Count 254 Free-fall Sensor Work Count Status Flag Definitions: Bit Flag Name 0 Pre-Failure/Advisory bit Definition If bit = 0, an Attribute Value less than or equal to its corresponding Attribute Threshold indicates an Advisory condition where the usage or age of the device has exceeded its intended design life period. If bit = 1, an Attribute Value less than or equal to its corresponding Attribute Threshold indicates a Pre-Failure condition where imminent loss of data is being predicted. 1 On-Line Collective bit 2-5 Reserved bits 6-15 Reserved bits Table 115 Status Flag Definitions If bit = 0, the Attribute Value is updated only during Off-Line testing. If bit = 1, the Attribute Value is updated during On-Line testing or during both On-Line and Off-Line testing. may either 0 or 1 Always 0 Normalized Values: The device will perform conversion of the raw Attribute Values to transform them into normalized values, which the host can then compare with the Threshold values. A Threshold is the excursion limit for a normalized Attribute Value. In normalizing the raw data, the device will perform any necessary statistical validity checks to ensure that an instantaneous raw value is not improperly reflected in the normalized Attribute Value (i.e., one read error in the first 10 reads being interpreted as exceeding the read error rate threshold when the subsequent 1 billion reads all execute without error). The end points for the normalized values for all Attributes will be 1 (01h) at the low end, and 100 (64h) at the high end for the device. For Performance and Error Rate Attributes, values greater than 100 are also possible, up to a maximum value of 253 (FDh). Page 150 of 176