Hitachi 7K320 Specifications - Page 158

Selective self-test log data structure, Error Reporting

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7K320 (SATA) OEM Specification 14.40.7 Selective self-test log data structure The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering. Description Bytes Offset Read/Write Data structure revision 2 00h R/W Starting LBA for test span 1 8 02h R/W Ending LBA for test span 1 8 0Ah R/W Starting LBA for test span 2 8 12A R/W Ending LBA for test span 2 8 1Ah R/W Starting LBA for test span 3 8 22h R/W Ending LBA for test span 3 8 2Ah R/W Starting LBA for test span 4 8 32h R/W Ending LBA for test span 4 8 3Ah R/W Starting LBA for test span 5 8 42h R/W Ending LBA for test span 5 8 4Ah R/W Reserved 256 52h Reserved Vendor specific 154 152h Vendor specific Current LBA under test 8 1ECh Read Current span under test 2 1F4h Read Feature flags 2 1F6 R/W Vendor specific 4 1F8h Vendor specific Selective self test pending time 2 1FCh R/W Reserved 1 1FEh Reserved Data structure checksum 1 1FFh R/W 512 Table 124 Selective self-test log data structure 14.40.8 Error Reporting The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device. Error Condition Status Register Error Register A S.M.A.R.T. FUNCTION SET command was received 51h 04h by the device without the required key being loaded into the LBA High and LBA Mid registers. A S.M.A.R.T. FUNCTION SET command was received 51h 04h by the device with a subcommand value in the Features Register that is either invalid or not supported by this device. A S.M.A.R.T. FUNCTION SET command subcommand 51h 04h other than S.M.A.R.T. ENABLE OPERATIONS was received by the device while the device was in a "S.M.A.R.T. disabled" state. The device is unable to read its Attribute Values or Attribute Thresholds data structure. 51h 10h or 40h The device is unable to write to its Attribute Values data 51h structure. 10h or 01h Table 125 S.M.A.R.T. Error Codes Page 158 of 176

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7K320 (SATA) OEM Specification
Page 158 of 176
14.40.7
Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log
allows the host to select the parameters for the self-test and to monitor the progress of the
self-test. The following table defines the contents of the Selective self-test log which is
512 bytes long. All multi-byte fields shown in these data structures follow the
specifications
for byte ordering.
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12A
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W
Ending LBA for test span 5
8
4Ah
R/W
Reserved
256
52h
Reserved
Vendor specific
154
152h
Vendor specific
Current LBA under test
8
1ECh
Read
Current span under test
2
1F4h
Read
Feature flags
2
1F6
R/W
Vendor specific
4
1F8h
Vendor specific
Selective self test pending time
2
1FCh
R/W
Reserved
1
1FEh
Reserved
Data structure checksum
1
1FFh
R/W
512
Table 124 Selective self-test log data structure
14.40.8
Error Reporting
The following table shows the values returned in the Status and Error Registers when specific
error conditions are encountered by a device.
Error Condition
Status Register
Error Register
A S.M.A.R.T. FUNCTION SET command was received
by the device without the required key being loaded into
the LBA High and LBA Mid registers.
51h
04h
A S.M.A.R.T. FUNCTION SET command was received
by the device with a subcommand value in the Features
Register that is either invalid or not supported by this
device.
51h
04h
A S.M.A.R.T. FUNCTION SET command subcommand
other than S.M.A.R.T. ENABLE OPERATIONS was
received by the device while the device was in a
“S.M.A.R.T. disabled” state.
51h
04h
The device is unable to read its Attribute Values or
Attribute Thresholds data structure.
51h
10h or 40h
The device is unable to write to its Attribute Values data
structure.
51h
10h or 01h
Table 125 S.M.A.R.T. Error Codes