Hitachi DK23EA Specifications - Page 64
a Raw Read Error Rate Measurement
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(2) Captive mode When executing a self-test in captive mode, the device sets BSY to one and executes the self-test routine after receipt of the command. At the end of the routine the device places the results of this routine in the Self-test execution status byte and executes command completion. If an error occurs while a device is performing the routine the device discontinues its testing, place the results of this routine in the Self-test execution status byte, and complete the command. (3) SMART off-line routine This routine only is performed in the off-line mode. The following tests are performed for the SMART off-line routine. a) Raw Read Error Rate Measurement Partial read scanning and Raw Read Error Rate measurement is performed. b) Automatic sector reallocation in off-line read scanning for entire LBA. (4) SMART Short self-test routine Depending on the value in the Sector Number register, this self-test routine is performed in either the captive or the off-line or mode. This self-test routine should take on the order of one minute to complete. The following tests are performed for the SMART short self-test routine: a) Read test Partial read scanning and Raw Read Error Rate measurement is performed. b) Write test User data area is not utilized, A part of the factory data area is used. Write and Read test is performed for each head. c) Servo test Position Error Signal is checked for certain rotations in order to analyze RRO and settling accuracy. d) Partial read scan test Scans the first 300MB and the last 100MB 0f the device. e) Seek performance test Measures average seek time. f) Throughput performance test Measures throughput in the partial read scan test. g) RAM test Diagnoses buffer RAM and SDRAM. h) SMART parameter verify Detects a threshold exceed condition. K6602637 Rev.3 02.27.01 - 64 -