Hitachi DK23EA Specifications - Page 69

(2) SMART Self-test Log Sector [Log Sector Address = 06h] Following Table defines the 512 bytes that make up the SMART self-test log sector. Byte Descriptions 0 - 1 Self-test log data structure revision number 2 - 25 26 - 49 The value of Self-test log data structure revision number is 0001h 1st descriptor entry 2nd descriptor entry : 482 - 505 : 21st descriptor entry 506 - 507 Vendor Specific 508 Self Test index The self-test index points to the most recent entry. Initially, when the log is empty, the index is set to zero. It is set to one when the first entry is made, two for the second entry, etc., until the 22nd entry, when the index is reset to one. 509 - 510 Reserved 511 Data structure checksum Self-test log descriptor entry This log is viewed as a circular buffer. The first entry begins at byte 2, the second entry begins at byte 26, and so on until the twenty-second entry, that replaces the first entry. Then, the twenty-third entry replaces the second entry, and so on. If fewer than 21 self-tests have been performed by the device, the unused descriptor entries are filled with zeros. The content of the self-test descriptor entry is shown in following table. Table 6.16 Self-test log descriptor entry Byte Descriptions n Content of the Sector Number Content of the Sector Number register is the content of the Sector Number register when the Nth self-test subcommand was issued. n+1 Content of the self-test execution status byte Content of the self-test execution status byte is the content of the self-test execution status byte when the Nth self-test was completed. n+2 ~ n+3 Life timestamp Life timestamp contains the power-on lifetime of the device in hours when the Nth self-test subcommand was completed. n+4 Content of the self-test failure checkpoint byte Content of the self-test failure checkpoint byte is the content of the self-test failure checkpoint byte when the Nth self-test was completed. n+5 ~ n+8 Falling LBA The failing LBA is the LBA of the uncorrectable sector that caused the test to fail. If the device encountered more than one uncorrectable sector during the test, this field shall indicate the LBA of the first uncorrectable sector encountered. If the test passed or the test failed for some reason other than an uncorrectable sector, the value of this field is undefined. n+9 ~ n+23 Vendor Specific K6602637 Rev.3 02.27.01 - 69 -