Panasonic BT-4LH310 Parts List - Page 3
Electrostatically Sensitive Es Devices, 6. X-radiation
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1-5. ELECTROSTATICALLY SENSITIVE (ES) DEVICES Some semiconductor (solid state) devices can be damaged easily by static electricity. Such components commonly are called Electrostatically sensitive (ED) Devices. Examples of typical ES devices are integrated circuits and some field-effect transistors and semiconductor "chip" components. The following techniques should be used to help reduce the incidence of component damage caused by static electricity. 1 Immediately before handling any semiconductor component or semiconductor-equipped assembly, drain off any electrostatic charge on your body by touching a known earth ground. Alternatively, obtain and wear a commercially available discharging wrist trap device, which should be removed for potential shock reasons prior to applying power to the unit under test. 2 After removing an electrical assembly equipped with ES devices, place the assembly on a conductive surface such as aluminum foil, to prevent electrostatic charge buildup or exposure of the assembly. 3 Use only a grounded tip soldering iron to solder or unsolder ES devices. 4 Use only an anti-static solder removal device classified as "anti-static" can generate electrical charges sufficient to damage ES devices. 5 Do not use freon-propelled chemicals. These can generate electrical charges sufficient to damage ES devices. 6 Do not remove a replacement ES device from its protective package until immediately before you are ready to install it. (most replacement ES devices are package with leads electrically shorted together by conductive foam, aluminum foil or comparable conductive material). 7 Immediately before removing the protective material from the leads of a replacement ES device, touch the protective material to the chassis or circuit assembly into which the device will be installed. CAUTION: Be sure no power is applied to the chassis or circuit, and observe all other safety precautions. 8 Minimize bodily motions when handling unpackaged replacement ES devices. (Otherwise hamless motion such as the brushing together of your clothes fabric or the lifting of your foot from a carpeted floor can generate static electricity sufficient to damage an ES device). 1-6. X-RADIATION X-RADIATION 1 The potential source of X-radiation in EVF sets is the High Voltage section and the picture tube. 2 When using a picture tube test jig for service, ensure that jig is capable of handling 10kV without causing X-Radiation. Note: It is important to use an accurate periodically calibrated high voltage meter. 3 Measure the High Voltage. The meter (electric type) reading should indicate 2.5kV, ±0.15kV. If the meter indication is out of tolerance, immediate service and correction is required to prevent the possibility of premature component failure. To prevent an X-Radiation possibility, it is essential to use the specified picture tube. 3