Intel X5365 Design Guide - Page 89
C.2.5 Preload Degradation under Bake Conditions, Record continuous load cell data as follows
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Heatsink Clip Load Methodology C.2.5 4. Collect continuous load cell data at 1 Hz for the duration of the test. A minimum time to allow the load cell to settle is generally specified by the load cell vendors (often on the order of 3 minutes). The time zero reading should be taken at the end of this settling time. 5. Record the preload measurement (total from all three load cells) at the target time and average the values over 10 seconds around this target time as well, i.e. in the interval for example over [target time - 5 seconds; target time + 5 seconds]. Preload Degradation under Bake Conditions This section describes an example of testing for potential clip load degradation under bake conditions. 1. Preheat thermal chamber to target temperature (45 ºC or 85 ºC for example). 2. Repeat time-zero, room temperature preload measurement. 3. Place unit into preheated thermal chamber for specified time. 4. Record continuous load cell data as follows: Sample rate = 0.1 Hz for first 3 hrs Sample rate = 0.01 Hz for the remainder of the bake test 5. Remove assembly from thermal chamber and set into room temperature conditions 6. Record continuous load cell data for next 30 minutes at sample rate of 1 Hz. § Quad-Core Intel® Xeon® Processor 5300 Series Thermal/Mechanical Design Guidelines (TMDG) 89