Toshiba A105 S4064 Maintenance Manual - Page 119

Extended Memory Start Address and Extended Memory End

Page 119 highlights

3.6 Memory Test 3 Diagnostic Programs Test Range: Specify the test coverage range of Extended Momory. If user chooses Total Size, it means that the whole Extended Momory will be tested. Although user can input the parameter into other select box, but the selected result is invalid. If user chooses Special Size, the test of Extended Momory will be taken according to the coverage range that user chooses or time. Extended Memory Start Address and Extended Memory End Address (MB): Set the range of extended memory that is to be tested. The test coverage will be according to the value setting in 'Percent (%)' mentioned at below. Percent (%): Choose the percentage of the defined range of the memory to be tested. Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested; Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested. 1. Write/Read Cycle Test Test by using both read and write instructions. 2. Read Cycle Test Test by using read instructions. Subtest 05 Walking 1's Test The test item is to ensure that there is no short circuitry issue in memory chip. The parameter dialog window is the same as that in 'Subtest 02 Pattern'. Subtest 06 Walking 0's Test Satellite A100/A105 / TECRA A7 Maintenance Manual 43

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3.6 Memory Test
3
Diagnostic Programs
Satellite A100/A105 / TECRA A7 Maintenance Manual
43
Test Range:
Specify the test coverage range of Extended Momory. If
user chooses Total Size, it means that the whole Extended Momory
will be tested. Although user can input the parameter into other select
box, but the selected result is invalid. If user chooses Special Size, the
test of Extended Momory will be taken according to the coverage
range that user chooses or time.
Extended Memory Start Address and Extended Memory End
Address (MB)
: Set the range of extended memory that is to be tested.
The test coverage will be according to the value setting in ‘Percent
(%)’ mentioned at below.
Percent (%):
Choose the percentage of the defined range of the
memory to be tested.
Time Limit(h):
Choose or Input the time (hour) of the defined range
of the memory to be tested;
Time Limit(m):
Choose or Input the time (minute) of the defined
range of the memory to be tested.
1.
Write/Read Cycle Test
Test by using both read and write instructions.
2.
Read Cycle Test
Test by using read instructions.
Subtest 05
Walking 1’s Test
The test item is to ensure that there is no short circuitry issue in memory chip. The
parameter dialog window is the same as that in ‘Subtest 02 Pattern’.
Subtest 06
Walking 0’s Test