Fujitsu MHT2030AT Manual/User Guide - Page 143

Smart Read Log

Page 143 highlights

5.3 Host Commands Table 5.7 Features Register values (subcommands) and functions (2 of 3) Features Resister X'D5' Function SMART READ LOG: A device which receives this sub-command asserts the BSY bit, then reads the log sector specified in the SN register. Next, it clears the BSY bit and transmits the log sector to the host computer. SN: 00h: 01h: 02h: 06h: 09h: 80h-9Fh: SC: 01h: 01h: 33h: 01h: 01h: 01h-10h: Log sector SMART log directory SMART summary error log SMART comprehensive error log SMART self-test log SMART selective self-test log Host vendor log X'D6' * See Table 5.11 concerning the SMART error log data format. See Table 5.12 concerning the SMART self-test log data format. See Table 5.13 concerning the SMART selective self-test log data format. SMART WRITE LOG: A device which receives this sub-command asserts the BSY bit and when it has prepared to receive data from the host computer, it sets DRQ and clears the BSY bit. Next, it receives data from the host computer and writes the specified log sector in the SN register. SN: SC: 09h: 01h: 80h-9Fh: 01h-10h Log sector SMART selective self-test log Host vendor log X'D8' X'D9' * The host can write any desired data in the host vendor log. SMART ENABLE OPERATIONS: This subcommand enables the failure prediction feature. The setting is maintained even when the device is turned off and then on. When the device receives this subcommand, it asserts the BSY bit, enables the failure prediction feature, then clears the BSY bit. SMART DISABLE OPERATIONS: This subcommand disables the failure prediction feature. The setting is maintained even when the device is turned off and then on. When the device receives this subcommand, it asserts the BSY bit, disables the failure prediction feature, then clears the BSY bit. C141-E192-02EN 5-69

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5.3
Host Commands
C141-E192-02EN
5-69
Table 5.7
Features Register values (subcommands) and functions (2 of 3)
Features Resister
Function
X’D5’
SMART READ LOG:
A device which receives this sub-command asserts the BSY bit, then reads
the log sector specified in the SN register.
Next, it clears the BSY bit and
transmits the log sector to the host computer.
SN:
SC:
Log sector
00h:
01h:
SMART log directory
01h:
01h:
SMART summary error log
02h:
33h:
SMART comprehensive error log
06h:
01h:
SMART self-test log
09h:
01h:
SMART selective self-test log
80h-9Fh: 01h-10h:
Host vendor log
*
See Table 5.11 concerning the SMART error log data format.
See Table 5.12 concerning the SMART self-test log data format.
See Table 5.13 concerning the SMART selective self-test log data
format.
X’D6’
SMART WRITE LOG:
A device which receives this sub-command asserts the BSY bit and when it
has prepared to receive data from the host computer, it sets DRQ and clears
the BSY bit. Next, it receives data from the host computer and writes the
specified log sector in the SN register.
SN:
SC:
Log sector
09h:
01h:
SMART selective self-test log
80h-9Fh: 01h-10h
Host vendor log
*
The host can write any desired data in the host vendor log.
X’D8’
SMART ENABLE OPERATIONS:
This subcommand enables the failure prediction feature.
The setting is
maintained even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, enables
the failure prediction feature, then clears the BSY bit.
X’D9’
SMART DISABLE OPERATIONS:
This subcommand disables the failure prediction feature.
The setting is
maintained even when the device is turned off and then on.
When the device receives this subcommand, it asserts the BSY bit, disables
the failure prediction feature, then clears the BSY bit.