Hitachi HTS541680J9AT00 Specifications - Page 156

Device Attributes Data Structure

Page 156 highlights

Travelstar 5K160 (PATA) Hard Disk Drive Specification The Sector Count register shall be set to specify the feature to be enabled or disabled. Sector Count Feature Description 00h Disable Automatic Off-line 01h Disable Off-line Read Scanning F8h Enable Automatic Off-line F9h Enable Off-line Read Scanning A value of zero written by the host into the device's Sector Count register before issuing this subcommand shall cause the automatic off-line data collection feature to be disabled. Disabling this feature does not preclude the device from saving attribute values to non-volatile memory during some other normal operation such as during a power-on or power-off sequence or during an error recovery sequence. A value of one written by the host into the device's Sector Count register before issuing this subcommand shall cause the off-line read scanning feature to be disabled. The Device does not perform the off-line read scanning at the off-line data collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) or automatically if the off-line read scanning feature is disabled. A value of F8h written by the host into the device's Sector Count register before issuing this subcommand shall cause this the automatic Off-line data collection feature to be enabled. A value of F9 written by the host into the device's Sector Count register before issuing this subcommand shall cause the off-line read scanning feature to be enabled. The Device perform the off-line read scanning at the off-line data collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) even if the automatic off-line feature is disabled. Any other non-zero value written by the host into this register before issuing this subcommand is vender specific and will not change the current Automatic Off-Line Data Collection and Off-line Read Scanning status, but device may respond with the error code specified in "Figure 118 S.M.A.R.T. Error Codes" on page 164. 14.39.2 Device Attributes Data Structure The following defines the 512 bytes that make up the Attribute Value information. This data structure is accessed by the host in its entirety using the S.M.A.R.T. Read Attribute Values subcommand. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specification for byte ordering, namely that the least significant byte occupies the lowest numbered byte address location in the field. Description Data Structure Revision Number 1st Device Attribute ... ... 30th Device Attribute Off-line data collection status Self-test execution status Total time in seconds to complete off-line data collection activity Current segment pointer Off-line data collection capability S.M.A.R.T. capability S.M.A.R.T. device error logging capability Self-test failure check point Short self-test completion time in minutes Extended self-test completion time in minutes Reserved Vendor specific Data structure checksum (*1) - See following definitions (*2) - Value varied by actual operating condition (*3) - Filled with 00h Figure 106 Device Attribute Data Structure Bytes Offset Format Value 2 00h binary 0010h 12 02h (*1) (*2) .. .. 12 15Eh (*1) (*2) 1 16Ah (*1) (*2) 1 16Bh (*1) (*2) 2 16Ch (*1) (*2) 1 16Eh (*1) (*2) 1 16Fh (*1) 1Bh 2 170h (*1) 0003h 1 172h (*1) 01h 1 173h (*1) (*2) 1 174h (*1) (*2) 1 175h (*1) (*2) 12 176h (*3) 125 182h (*3) 1 1FFh (*1) (*2) 512 156/188

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Travelstar 5K160 (PATA) Hard Disk Drive Specification
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188
The Sector Count register shall be set to specify the feature to be enabled or disabled.
Sector Count
Feature Description
00h
Disable Automatic Off-line
01h
Disable Off-line Read Scanning
F8h
Enable Automatic Off-line
F9h
Enable Off-line Read Scanning
A value of zero written by the host into the device's Sector Count register before issuing this subcommand shall
cause the automatic off-line data collection feature to be disabled. Disabling this feature does not preclude the
device from saving attribute values to non-volatile memory during some other normal operation such as during a
power-on or power-off sequence or during an error recovery sequence.
A value of one written by the host into the device's Sector Count register before issuing this subcommand shall
cause the off-line read scanning feature to be disabled. The Device does not perform the off-line read scanning at the
off-line data collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate(Subcommand
D4h) or automatically if the off-line read scanning feature is disabled.
A value of F8h written by the host into the device's Sector Count register before issuing this subcommand shall
cause this
the automatic Off-line data collection feature to be enabled.
A value of F9 written by the host into the device's Sector Count register before issuing this subcommand shall cause
the off-line read scanning feature to be enabled. The Device perform the off-line read scanning at the off-line data
collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) even if the
automatic off-line feature is disabled.
Any other non-zero value written by the host into this register before issuing this subcommand is vender specific
and will not change the current Automatic Off-Line Data Collection and Off-line Read Scanning status, but device
may respond with the error code specified in "Figure 118 S.M.A.R.T. Error Codes" on page 164.
14.39.2 Device Attributes Data Structure
The following defines the 512 bytes that make up the Attribute Value information. This data structure is accessed by
the host in its entirety using the S.M.A.R.T. Read Attribute Values subcommand. All multi-byte fields shown in
these data structures follow the ATA/ATAPI-7 specification for byte ordering, namely that the least significant byte
occupies the lowest numbered byte address location in the field.
Description
Bytes
Offset
Format
Value
Data Structure Revision Number
2
00h
binary
0010h
1st Device Attribute
12
02h
(*1)
(*2)
...
..
...
..
30th Device Attribute
12
15Eh
(*1)
(*2)
Off-line data collection status
1
16Ah
(*1)
(*2)
Self-test execution status
1
16Bh
(*1)
(*2)
Total time in seconds to complete off-line data collection activity
2
16Ch
(*1)
(*2)
Current segment pointer
1
16Eh
(*1)
(*2)
Off-line data collection capability
1
16Fh
(*1)
1Bh
S.M.A.R.T. capability
2
170h
(*1)
0003h
S.M.A.R.T. device error logging capability
1
172h
(*1)
01h
Self-test failure check point
1
173h
(*1)
(*2)
Short self-test completion time in minutes
1
174h
(*1)
(*2)
Extended self-test completion time in minutes
1
175h
(*1)
(*2)
Reserved
12
176h
(*3)
Vendor specific
125
182h
(*3)
Data structure checksum
1
1FFh
(*1)
(*2)
512
(*1) - See following definitions
(*2) - Value varied by actual operating condition
(*3) - Filled with 00h
Figure 106 Device Attribute Data Structure