Hitachi HTS541680J9AT00 Specifications - Page 163

Self-test log data structure, 39.7 Selective self-test log data structure

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Travelstar 5K160 (PATA) Hard Disk Drive Specification 14.39.6 Self-test log data structure The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering. Description Bytes Offset Data structure revision 2 00h Self-test number 1 n*18h+02h Self-test execution status 1 n*18h+03h Life time power on hours 2 n*18h+04h Self-test failure check point 1 n*18h+06h LBA of first failure 4 n*18h+07h Vendor specific 15 n*18h+0Bh ... Vendor specific 2 1FAh Self-test log pointer 1 1FCh Reserved 2 1FDh Data structure checksum 1 1FFh 512 Note: n is 0 through 20 Figure 116 Self-test log data structure The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors have been recorded, the oldest descriptor will be overwritten with new descriptor. Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is descriptor(s) the value is 1 through 21. 14.39.7 Selective self-test log data structure The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the specifications for byte ordering. Description Bytes Offset Read/Write Data structure revision 2 00h R/W Starting LBA for test span 1 8 02h R/W Ending LBA for test span 1 8 0Ah R/W Starting LBA for test span 2 8 12A R/W Ending LBA for test span 2 8 1Ah R/W Starting LBA for test span 3 8 22h R/W Ending LBA for test span 3 8 2Ah R/W Starting LBA for test span 4 8 32h R/W Ending LBA for test span 4 8 3Ah R/W Starting LBA for test span 5 8 42h R/W Ending LBA for test span 5 8 4Ah R/W Reserved 256 52h Reserved Vendor specific 154 152h Vendor specific Current LBA under test 8 1ECh Read Current span under test 2 1F4h Read Feature flags 2 1F6 R/W Vendor specific 4 1F8h Vendor specific Selective self test pending time 2 1FCh R/W Reserved 1 1FEh Reserved Data structure checksum 1 1FFh R/W 512 Figure 117 Selective self-test log data structure 163/188

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Travelstar 5K160 (PATA) Hard Disk Drive Specification
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14.39.6 Self-test log data structure
The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data
structures follow the ATA/ATAPI-7 specifications for byte ordering.
Description
Bytes Offset
Data structure revision
2
00h
Self-test number
1
n*18h+02h
Self-test execution status
1
n*18h+03h
Life time power on hours
2
n*18h+04h
Self-test failure check point
1
n*18h+06h
LBA of first failure
4
n*18h+07h
Vendor specific
15
n*18h+0Bh
...
Vendor specific
2
1FAh
Self-test log pointer
1
1FCh
Reserved
2
1FDh
Data structure checksum
1
1FFh
512
Note: n is 0 through 20
Figure 116 Self-test log data structure
The data structure contains the descriptor of Self-test that the device has performed. Each descriptor is 24 bytes long
and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors have been recorded, the oldest descriptor will be overwritten with new descriptor.
Self-test log pointer points the most recent descriptor. When there is no descriptor the value is 0. When there is
descriptor(s) the value is 1 through 21.
14.39.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
specifications for byte ordering.
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12A
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W
Ending LBA for test span 5
8
4Ah
R/W
Reserved
256
52h
Reserved
Vendor specific
154
152h
Vendor specific
Current LBA under test
8
1ECh
Read
Current span under test
2
1F4h
Read
Feature flags
2
1F6
R/W
Vendor specific
4
1F8h
Vendor specific
Selective self test pending time
2
1FCh
R/W
Reserved
1
1FEh
Reserved
Data structure checksum
1
1FFh
R/W
512
Figure 117 Selective self-test log data structure