Intel Q9400S Data Sheet - Page 25

Example Overshoot Waveform

Page 25 highlights

Electrical Specifications 2.6.3 VCC Overshoot The processor can tolerate short transient overshoot events where VCC exceeds the VID voltage when transitioning from a high to low current load condition. This overshoot cannot exceed VID + VOS_MAX (VOS_MAX is the maximum allowable overshoot voltage). The time duration of the overshoot event must not exceed TOS_MAX (TOS_MAX is the maximum allowable time duration above VID). These specifications apply to the processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands. Table 2-5. VCC Overshoot Specifications Symbol Parameter Min Max Unit Figure Notes VOS_MAX Magnitude of VCC overshoot above VID - 50 mV 2-2 1 TOS_MAX Time duration of VCC overshoot above VID - 25 µs 2-2 1 NOTES: 1. Adherence to these specifications is required to ensure reliable processor operation. Figure 2-2. VCC Overshoot Example Waveform VID + 0.050 Example Overshoot Waveform VOS Voltage [V] VID - 0.000 2.6.4 TOS 0 5 10 15 20 25 Time [us] TOS: Overshoot time above VID VOS: Overshoot above VID NOTES: 1. VOS is measured overshoot voltage. 2. TOS is measured time duration above VID. Die Voltage Validation Overshoot events on processor must meet the specifications in Table 2-5 when measured across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are < 10 ns in duration may be ignored. These measurements of processor die level overshoot must be taken with a bandwidth limited oscilloscope set to a greater than or equal to 100 MHz bandwidth limit. Datasheet 25

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Datasheet
25
Electrical Specifications
2.6.3
V
CC
Overshoot
The processor can tolerate short transient overshoot events where V
CC
exceeds the VID
voltage when transitioning from a high to low current load condition. This overshoot
cannot exceed VID + V
OS_MAX
(V
OS_MAX
is the maximum allowable overshoot voltage).
The time duration of the overshoot event must not exceed T
OS_MAX
(T
OS_MAX
is the
maximum allowable time duration above VID). These specifications apply to the
processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands.
NOTES:
1.
V
OS
is measured overshoot voltage.
2.
T
OS
is measured time duration above VID.
2.6.4
Die Voltage Validation
Overshoot events on processor must meet the specifications in
Table 2-5
when
measured across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are
< 10 ns in duration may be ignored. These measurements of processor die level
overshoot must be taken with a bandwidth limited oscilloscope set to a greater than or
equal to 100 MHz bandwidth limit.
Table 2-5.
V
CC
Overshoot Specifications
Symbol
Parameter
Min
Max
Unit
Figure
Notes
V
OS_MAX
Magnitude of V
CC
overshoot above
VID
50
mV
2-2
1
NOTES:
1.
Adherence to these specifications is required to ensure reliable processor operation.
T
OS_MAX
Time duration of V
CC
overshoot above
VID
25
μs
2-2
1
Figure 2-2.
V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0
5
10
15
20
25
Time [us]
Voltage [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID