Toshiba A60 S1591 Maintenance Manual - Page 108

3 Diagnostic Programs 3.6 Memory Test The test item is to ensure that there is no short circuitry issue in memory chip. The parameter dialog window is the same as that in 'Subtest 02 Pattern'. Subtest 05 Walking 0's Test The test item is to ensure that there is no open circuitry issue in memory chip. The parameter dialog window is the same as that in 'Subtest 02 Pattern'. Subtest 06 Memory Address This test item is to check short and open issue on memory address lines. Subtest 07 Refresh Test This test item is to check whether the memory refresh works normally. The parameter dialog window is as follows: Subtest 08 Cache Memory The test item is to check whether the CPU internal cache memory could be accessed correctly. Subtest 09 Random Memory Random Memory test includes the following two test items: Ra ndomize Test and Random Incremental Read/Write Test. The parameter dialog window is the same as that in 'Subtest 03 Extended Pattern'. 1. Randomize Test This test item is to check whether the memory could be correctly accessed with randomized data and randomized memory address. 2. Random Increment Read/Write 38 dynabook AX/Satellite AW2/Equium A60/Satellite A60/ Satellite Pro A60 A65 Maintenance Manual