Hitachi C4K60 Specifications - Page 81

Extended SMART Self-test Log [Log Sector Address = 07h], Extended Self-test log descriptor

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7.5.17.3. Extended SMART Self-test Log [Log Sector Address = 07h] The results of SMART short self-test routine, extended self-test routine and SMART selective self-test routine are gathered in Extended SMART self-test log. This log is viewed as a circular buffer. All unused selftest descriptors are filled with zeros. Only 28-bit error entries contain in the SMART self-test log, Both 28-bit error entries and 48-bit error entries contain in the Extended SMART self-test log. Table 7.17 defines the format of each of the sectors that comprise the Extended SMART Self-test log. Table 7.17 Extended SMART Self-test Log Byte 0 1 2 - 3 4 - 29 30 - 55 : 446 - 471 472 - 499 500 -510 511 Description Self-test log data structure revision number "01h" Reserved Self-test descriptor index The index points to the most recent entry. When the log is empty, the index is set to zero. 1st descriptor entry 2nd descriptor entry : 18th descriptor entry Vendor Specific Reserved Data structure checksum (1) Extended Self-test log descriptor entry Table 7.18 Self-test log descriptor entry Byte n n+1 n+2 ~ n+3 n+4 n+5 ~ n+10 n+11 ~ n+29 Description Content of the LBA Low (Sector Number) Register This contains the content of the LBA Low (Sector Number) Register when the Nth selftest subcommand was issued. Content of the self-test execution status byte This contains the result of self-test routine when the Nth self-test was completed. Life timestamp This contains the Power-on lifetime of the device in hours when the Nth self-test subcommand was completed. Content of the self-test failure checkpoint byte This contains additional information about the self-test routine that failed. Falling LBA The failing LBA is the LBA of the uncorrectable sector that caused the test to fail. If the device encountered more than one uncorrectable sector during the test, this field indicates the LBA of the first uncorrectable sector encountered. If the test passed or the test failed for some reason other than an uncorrectable sector, the value of this field is undefined. Vendor Specific K6610170 Rev.2 Dec 22, 2004 - 81 -

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K6610170
Rev.2
Dec 22, 2004
- 81 -
7.5.17.3. Extended SMART Self-test Log [Log Sector Address = 07h]
The results of SMART short self-test routine, extended self-test routine and SMART selective self-test
routine are gathered in Extended SMART self-test log. This log is viewed as a circular buffer. All unused self-
test descriptors are filled with zeros. Only 28-bit error entries contain in the SMART self-test log, Both 28-bit
error entries and 48-bit error entries contain in the Extended SMART self-test log. Table 7.17 defines the
format of each of the sectors that comprise the Extended SMART Self-test log.
Table 7.17 Extended SMART Self-test Log
Byte
Description
0
Self-test log data structure revision number "01h"
1
Reserved
2 - 3
Self-test descriptor index
The index points to the most recent entry. When the log is empty, the index is set to zero.
4 - 29
1
st
descriptor entry
30 - 55
2
nd
descriptor entry
:
:
446 - 471
18
th
descriptor entry
472 - 499
Vendor Specific
500 -510
Reserved
511
Data structure checksum
(1) Extended Self-test log descriptor entry
Table 7.18 Self-test log descriptor entry
Byte
Description
n
Content of the LBA Low (Sector Number) Register
This contains the content of the LBA Low (Sector Number) Register when the Nth self-
test subcommand was issued.
n+1
Content of the self-test execution status byte
This contains the result of self-test routine when the Nth self-test was completed.
n+2 ~ n+3
Life timestamp
This contains the Power-on lifetime of the device in hours when the Nth self-test
subcommand was completed.
n+4
Content of the self-test failure checkpoint byte
This contains additional information about the self-test routine that failed.
n+5 ~ n+10
Falling LBA
The failing LBA is the LBA of the uncorrectable sector that caused the test to fail. If the
device encountered more than one uncorrectable sector during the test, this field
indicates the LBA of the first uncorrectable sector encountered. If the test passed or the
test failed for some reason other than an uncorrectable sector, the value of this field is
undefined.
n+11 ~ n+29
Vendor Specific