Intel X5365 Design Guide - Page 93

E Quality and Reliability Requirements, E.1 Intel Verification Criteria for the Reference Designs

Page 93 highlights

Quality and Reliability Requirements E Quality and Reliability Requirements E.1 E.1.1 E.1.2 E.1.2.1 Intel Verification Criteria for the Reference Designs Reference Heatsink Thermal Verification The Intel reference heatsinks will be verified within specific boundary conditions using a TTV and the methodology described in the Intel® Xeon® Processor Family Thermal Test Vehicle User's Guide. The test results, for a number of samples, are reported in terms of a worst-case mean + 3σ value for thermal characterization parameter using real processors (based on the TTV correction offset). Environmental Reliability Testing Structural Reliability Testing The Intel reference heatsinks will be tested in an assembled condition, along with the LGA771 Socket. Details of the Environmental Requirements, and associated stress tests, can be found in the LGA771 Socket Mechanical Design Guide. The use condition environment definitions provided in Appendix E-1 are based on speculative use condition assumptions, and are provided as examples only. Quad-Core Intel® Xeon® Processor 5300 Series Thermal/Mechanical Design Guidelines (TMDG) 93

  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • 10
  • 11
  • 12
  • 13
  • 14
  • 15
  • 16
  • 17
  • 18
  • 19
  • 20
  • 21
  • 22
  • 23
  • 24
  • 25
  • 26
  • 27
  • 28
  • 29
  • 30
  • 31
  • 32
  • 33
  • 34
  • 35
  • 36
  • 37
  • 38
  • 39
  • 40
  • 41
  • 42
  • 43
  • 44
  • 45
  • 46
  • 47
  • 48
  • 49
  • 50
  • 51
  • 52
  • 53
  • 54
  • 55
  • 56
  • 57
  • 58
  • 59
  • 60
  • 61
  • 62
  • 63
  • 64
  • 65
  • 66
  • 67
  • 68
  • 69
  • 70
  • 71
  • 72
  • 73
  • 74
  • 75
  • 76
  • 77
  • 78
  • 79
  • 80
  • 81
  • 82
  • 83
  • 84
  • 85
  • 86
  • 87
  • 88
  • 89
  • 90
  • 91
  • 92
  • 93
  • 94
  • 95
  • 96
  • 97
  • 98
  • 99
  • 100

Quad-Core Intel® Xeon® Processor 5300 Series Thermal/Mechanical Design Guidelines (TMDG)
93
Quality and Reliability Requirements
E
Quality and Reliability
Requirements
E.1
Intel Verification Criteria for the Reference
Designs
E.1.1
Reference Heatsink Thermal Verification
The Intel reference heatsinks will be verified within specific boundary conditions using a
TTV and the methodology described in the
Intel
®
Xeon
®
Processor Family Thermal Test
Vehicle User's Guide
.
The test results, for a number of samples, are reported in terms of a worst-case mean
+ 3
σ
value for thermal characterization parameter using real processors (based on the
TTV correction offset).
E.1.2
Environmental Reliability Testing
E.1.2.1
Structural Reliability Testing
The Intel reference heatsinks will be tested in an assembled condition, along with the
LGA771 Socket. Details of the Environmental Requirements, and associated stress
tests, can be found in the
LGA771 Socket Mechanical Design Guide
.
The use condition environment definitions provided in
Appendix E-1
are based on
speculative use condition assumptions, and are provided as examples only.