Hitachi HDS728080PLAT20 Specifications - Page 160
Extended Self-test log sector
UPC - 829686000094
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Note: bits (7:0) refer to the contents if the register is read with bit 7 of the Device Control register cleared to zero. Bits (15:8) refer to the contents if the register is read with bit 7 of the Device Control register set to one. State shall contain a value indicating the state of the device when the command was issued to the device or the reset occurred as described below. Value x0h x1h x2h x3h x4h x5h-xAh xBh-xFh State Unknown Sleep Standby Active/Idle SMART Off-line or Self-test Reserved Vendor specific 12.17.2.4 Device error count This field shall contain the total number of errors attributable to the device that have been reported by the device during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If the maximum value for this field is reached the count shall remain at the maximum value when additional errors are encountered and logged. 12.17.3 Extended Self-test log sector The figure below defines the format of each of the sectors that comprise the Extended SMART self-test log. The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained in the SMART self-test log, defined in 11.42.6, "Self-test log data structure" on page0203, shall also be included in the Extended SMART self-test log with all 48-bit entries. Description Self-test log data structure revision number Reserved Self-test descriptor index (7:0) Self-test descriptor index (15:8) Descriptor entry 1 Descriptor entry 2 ... Descriptor entry 18 Vendor specific Reserved Data structure checksum Bytes 1 1 1 1 26 25 Offset 00h 01h 02h 03h 04h 1Eh 26 1D8h 2 1F2h 11 1F4h 1 1FFh 512 These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros. Deskstar 7K80 Hard Disk Drive Specification 156