Hitachi HDS728080PLAT20 Specifications - Page 224

Self-test log data structure

Page 224 highlights

Life time stamp (hours) 2 1Ch 30 The state field contains a value indicating the device state when command was issued to the device. Value x0h x1h x2h x3h x4h x5h-xAh xBh-xFh State Unknown Sleep Standby Active/Idle S.M.A.R.T. Off-line or Self-test Reserved Vendor specific The value of 'x' is vendor specific 12.42.6 Self-test log data structure The following table defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these data structures follow the ATA/ATAPI-5 specifications for byte ordering. Table 154: Self-test log data structure Description Data structure revision Self-test number Self-test execution status Life time power on hours Self-test failure check point LBA of first failure Vendor specific ... Vendor specific Self-test log pointer Reserved Data structure checksum Byte Offset 2 00h 1 n*18h+02h 1 n*18h+03h 2 n*18h+04h 1 n*18h+06h 4 n*18h+07h 15 n*18h+08h 2 1FAh 1 1FCh 2 1FDh 1 1FFh 512 Note: N is 0 through 20 The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes long and the self-test data structure is capable to contain up to 21 descriptors. After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor. The self-test log index points to the most recent descriptor. When there is no descriptor, the value is 0. When there are one or more descriptors, the value is 1 through 21. Deskstar 7K80 Hard Disk Drive Specification 220

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Deskstar 7K80 Hard Disk Drive Specification
220
The state field contains a value indicating the device state when command was issued to the device.
The value of ’x’ is vendor specific
12.42.6
Self-test log data structure
The following table defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these
data structures follow the ATA/ATAPI-5 specifications for byte ordering.
Table 154: Self-test log data structure
Note:
N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes
long and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor.
The self-test log index points to the most recent descriptor. When there is no descriptor, the value is 0. When there
are one or more descriptors, the value is 1 through 21.
Life time stamp (hours)
2
1Ch
30
Value
State
x0h
Unknown
x1h
Sleep
x2h
Standby
x3h
Active/Idle
x4h
S.M.A.R.T. Off-line or Self-test
x5h-xAh
Reserved
xBh-xFh
Vendor specific
Description
Byte
Offset
Data structure revision
2
00h
Self-test number
1
n*18h+02h
Self-test execution status
1
n*18h+03h
Life time power on hours
2
n*18h+04h
Self-test failure check point
1
n*18h+06h
LBA of first failure
4
n*18h+07h
Vendor specific
15
n*18h+08h
...
Vendor specific
2
1FAh
Self-test log pointer
1
1FCh
Reserved
2
1FDh
Data structure checksum
1
1FFh
512