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Lenovo ThinkCentre M50 Hardware Maintenance Manual (HMM) - Page 23

Fixed-Disk, Tests, Other, Features, Multitasking, Destructive, non-destructive, testing

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Fixed-Disk Tests: v Seek Tests - checks the physical operation of the drive head. - Linear Seek - Random Seek - Min-Max Seek - Butterfly Seek v Verify Tests - checks the integrity of the data present on the media. - Linear Verify - Random Verify v Surface Scan Tests - checks the drive media for defects. - Surface Scan (Linear) - Surface Scan (Aggressive) - this is disabled for normal customer use. - Surface Scan (Random) v SMART - checks the SMART functionality for drives that support SMART. - Start SMART Self-Test - Get SMART test results Other Test Features: v Write-Splice Repair - detects and corrects Error Correction Code errors during Verify tests. v Auto Spin Down - a gradual spin down of the drive platters to avoid damaging the media. v Manufacturer Log - an in-depth manufacturer supported log of errors on the drive. Multitasking: To allow simultaneous testing of multiple hard drives whenever possible, the FDAT module is written as a set of multitasking functions. Each drive under test can run the same test or run a different test at the same time. Each subtest is written to handle a single test pass and all test variables are kept track of in a structure unique for each drive. However, when testing IDE drives, FDAT will not perform simultaneous testing of IDE drives that are attached to the same IDE cable. For example, if FDAT is testing four IDE drives on a PC, it will perform simultaneous testing on drives 1 and 3 first (master drives), then perform tests on 2 and 4 (slave drives). FDAT will also perform simultaneous testing on a master and slave that are on separate IDE cables, but will not perform simultaneous tests on a master and slave on the same IDE cable. This generally increases the amount of time needed to test multiple IDE drives. Another limitation of FDAT'S multitasking capability is the use of Ultra DMA (UDMA). Only one drive at a time can access the UDMA channel and the UDMA channel buffer must be kept high in order to maintain a speed advantage over other data transfer modes. In order to use the UDMA channel during testing, users must disable the multitasking feature. Destructive vs non-destructive testing: Most of the tests found in FDAT are non-destructive. This means that PCDR will preserve any data that is present on the tested media prior to beginning any destructive operations (i.e. write operations). However, users can run certain tests Chapter 4. IBM Enhanced Diagnostics 17

Section	Page
Contents	5
Chapter 1. About this manual	7
Important Safety Information	7
Chapter 2. General information	9
Features	9
Physical specifications	11
Types 8185, 8186, 8192, 8413, and 8430	12
Types 8128, 8187, 8188, 8193, 8414, and 8431	13
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	14
Types 8196 and 8197	15
Chapter 3. General Checkout	17
Chapter 4. IBM Enhanced Diagnostics	21
Diagnostics program download	21
Navigating through the diagnostics programs	21
Running diagnostics tests	21
Test selection	22
Test results	22
Fixed disk advanced test (FDAT)	22
Quick and Full erase - hard drive	24
Viewing the test log	24
Chapter 5. IBM Setup Utility program	25
Starting the IBM Setup Utility program	25
Viewing and changing settings	25
Exiting from the IBM Setup Utility program	26
Using passwords	26
User password	26
Administrator password	26
Setting, changing, and deleting a password	26
Using Security Profile by Device	27
Using IDE Drives Setup	27
Selecting a startup device	28
Selecting a temporary startup device	28
Changing the startup device sequence	28
Chapter 6. Replacing FRUs	29
Locating connectors on the front	29
Types 8185, 8186, 8192, 8413, and 8430	29
Types 8128, 8187, 8188, 8193, 8414, and 8431	29
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	31
Types 8196 and 8197	31
Locating the connectors on the rear	33
Types 8185, 8186, 8192, 8413, and 8430	33
Types 8128, 8187, 8188, 8193, 8414, and 8431	33
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	35
Types 8196 and 8197	35
Removing the cover	36
Types 8185, 8186, 8192, 8413, and 8430	36
Types 8128, 8187, 8188, 8193, 8414, and 8431	37
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	37
Types 8196 and 8197	38
Locating components	40
Types 8185, 8186, 8192, 8413, and 8430	40
Types 8128, 8187, 8188, 8193, 8414, and 8431	41
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	42
Types 8196 and 8197	43
Identifying parts on the system board (all machine types)	44
Replacing memory (all machine types)	44
Replacing adapters	45
Types 8185, 8186, 8192, 8413, and 8430	45
Types 8128, 8187, 8188, 8193, 8414, and 8431	47
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	48
Types 8196 and 8197	48
Replacing internal drives	49
Types 8185, 8186, 8192, 8413, and 8430	49
Drive bay information	49
Removing a drive	50
Installing a drive	51
Types 8128, 8187, 8188, 8193, 8414, and 8431	51
Drive bay information	51
Removing a drive	52
Installing a drive	53
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	54
Drive bay information	54
Removing the drive	54
Installing a drive	55
Types 8196 and 8197	57
Drive bay information	57
Removing a drive	57
Installing a drive	59
Connecting the drive	60
Parallel ATA hard disk drive	60
Serial ATA hard disk drive	61
CD drive, DVD drive, CD/RW drive, or DVD/CD/RW combo drive	61
Diskette drive	61
Replacing the battery (all machine types)	62
Replacing the power supply	63
Types 8185, 8186, 8192, 8413, and 8430	63
Types 8128, 8187, 8188, 8193, 8414, and 8431	63
Types 8189, 8190, 8194, 8195, 8196, 8197, 8415, 8432, and 8433	64
Replacing a microprocessor (all machine types)	65
Replacing the system board (all machine types)	67
Replacing the cover and connecting the cables	69
Types 8185, 8186, 8192, 8413, and 8430	69
Types 8128, 8187, 8188, 8193, 8414, and 8431	70
Types 8189, 8190, 8194, 8195, 8415, 8432, and 8433	71
Types 8196 and 8197	72
Chapter 7. Symptom-to-FRU Index	75
Hard disk drive boot error	75
Power Supply Errors	76
Diagnostic error codes	76
Beep symptoms	95
No-beep symptoms	97
POST error codes	98
Miscellaneous error messages	113
Undetermined problems	115
Power supply connectors	116
Connector P1	116
Connector P2, P3, P4, and P7	116
Connector P5 (Diskette drive)	116
Connector P6	116
Connector P8 (Serial ATA)	116
Chapter 8. Additional Service Information	117
Security features	117
Passwords	117
Power-on password	117
Removing a power-on password	117
Administrator password	117
Administrator password control	118
Operating system password	118
Vital product data	118
BIOS levels	118
Erasing a lost or forgotten password (clearing CMOS)	119
Flash update procedures	119
Updating (flashing) BIOS from a diskette or CD-ROM	119
Updating (flashing) BIOS from your operating system	119
Recovering from a POST/BIOS update failure	120
Power management	121
Automatic configuration and power interface (ACPI) BIOS	121
Advanced Power Management	121
Automatic Hardware Power Management features	121
Setting Automatic Hardware Power Management features	121
Automatic Power-On features	122
Product Recovery Program	123
Chapter 9. Parts listing	125
Type 8128	125
Type 8185	127
Type 8186	136
Type 8187	140
Type 8188	155
Type 8189	164
Type 8190	178
Type 8192	184
Type 8193	186
Type 8194	194
Type 8195	208
Type 8196	217
Type 8197	221
Type 8413	224
Type 8414	229
Type 8415	235
Type 8430	238
Type 8431	242
Type 8432	247
Type 8433	250
Chapter 10. Related service information	253
Safety information	253
General safety	253
Electrical safety	254
Safety inspection guide	255
Handling electrostatic discharge-sensitive devices	256
Grounding requirements	257
Safety notices (multi-lingual translations)	257
Send us your comments!	286
Problem determination tips	287
Notices	287

Match case Limit results 1 per page

Fixed-Disk

Tests:

Seek

Tests

checks

the

physical

operation

the

drive

head.

–

Linear

Seek

–

Random

Seek

–

Min-Max

Seek

–

Butterfly

Seek

Verify

Tests

checks

the

integrity

the

data

present

the

media.

–

Linear

Verify

–

Random

Verify

Surface

Scan

Tests

checks

the

drive

media

for

defects.

–

Surface

Scan

(Linear)

–

Surface

Scan

(Aggressive)

this

disabled

for

normal

customer

use.

–

Surface

Scan

(Random)

SMART

checks

the

SMART

functionality

for

drives

that

support

SMART.

–

Start

SMART

Self-Test

–

Get

SMART

test

results

Other

Test

Features:

Write-Splice

Repair

detects

and

corrects

Error

Correction

Code

errors

during

Verify

tests.

Auto

Spin

Down

gradual

spin

down

the

drive

platters

avoid

damaging

the

media.

Manufacturer

Log

in-depth

manufacturer

supported

log

errors

the

drive.

Multitasking:

allow

simultaneous

testing

multiple

hard

drives

whenever

possible,

the

FDAT

module

written

set

multitasking

functions.

Each

drive

under

test

can

run

the

same

test

run

different

test

the

same

time.

Each

subtest

written

handle

single

test

pass

and

all

test

variables

are

kept

track

structure

unique

for

each

drive.

However,

when

testing

IDE

drives,

FDAT

will

not

perform

simultaneous

testing

IDE

drives

that

are

attached

the

same

IDE

cable.

For

example,

FDAT

testing

four

IDE

drives

PC,

will

perform

simultaneous

testing

drives

and

first

(master

drives),

then

perform

tests

and

(slave

drives).

FDAT

will

also

perform

simultaneous

testing

master

and

slave

that

are

separate

IDE

cables,

but

will

not

perform

simultaneous

tests

master

and

slave

the

same

IDE

cable.

This

generally

increases

the

amount

time

needed

test

multiple

IDE

drives.

Another

limitation

FDAT’S

multitasking

capability

the

use

Ultra

DMA

(UDMA).

Only

one

drive

time

can

access

the

UDMA

channel

and

the

UDMA

channel

buffer

must

kept

high

order

maintain

speed

advantage

over

other

data

transfer

modes.

order

use

the

UDMA

channel

during

testing,

users

must

disable

the

multitasking

feature.

Destructive

non-destructive

testing:

Most

the

tests

found

FDAT

are

non-destructive.

This

means

that

PCDR

will

preserve

any

data

that

present

the

tested

media

prior

beginning

any

destructive

operations

(i.e.

write

operations).

However,

users

can

run

certain

tests

Chapter

IBM

Enhanced

Diagnostics