IBM 2109 Service Guide - Page 111

centralmemorytest, Pressing Enter while

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Attention: This command cannot be executed on an operational switch. Before using the camTest command, disable the switch using the switchDisable command. Related error messages: DIAG-CAMINIT, DIAG-CAMSID, DIAG-XMIT centralmemorytest | Table 30 shows the centralMemoryTest command which verifies that the central | memory in each loom ASIC is functioning correctly by checking the following: v The built-in-self-repair (BISR) circuit in each loom chip does not report a failure to repair bad cells (bisr test). v The data cells are uniquely written and then read correctly (data write/read test). v The data in any one ASIC is read from any other ASIC (loom connection test). v Bad parity is detected and flagged in the error register and posts an interrupt (parity error test). v Buffer number errors are detected and flagged in the error register and post an interrupt (buffer number error test). v Chip number errors are detected and flagged in the error register and post an interrupt (chip number error test). Pressing Enter while centralMemoryTest is selected displays a reminder to take the switch offline, if it is not offline. If the message is displayed, take the switch | offline. | centralMemoryTest example: The centralMemoryTest command performs a bit | write and read test of the ASIC central memory. | Table 30. centralMemoryTest example | Synopsis centralMemoryTest [passCount, dataType, dataSeed] | Availability Administrator | Description Use this command to verify the address and data bus of the ASIC | SRAMs that serve as the central memory. | Below are possible error messages if failures are detected: | | DIAG-TIMEOUT | DIAG-BADINT | DIAG-CMERRTYPE | DIAG-CMERRPTN | Operands This command has the following operands. If all are omitted, the default | values used are 1 for passCount, QUAD_RAMP for dataType, and a | random value for dataSeed. | passCount The number of times to execute this test. | dataType The data type to use when writing the central memory. | The dataTypeShow command lists data types | allowed. | dataSeed The initial seed value used in generating the data | pattern. For example, a QUAD_RAMP pattern with a | seed value of 0xdead is as follows: 0xdead, 0xdeae, | 0xdeaf, 0xdeb0, ... | Some data types, such as BYTE_LFSR, do not require | a seed value. Appendix B. Diagnostics 95

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Attention:
This command cannot be executed on an operational switch. Before
using the
camTest
command, disable the switch using the
switchDisable
command.
Related error messages:
DIAG-CAMINIT, DIAG-CAMSID, DIAG-XMIT
centralmemorytest
Table 30 shows the
centralMemoryTest
command which verifies that the central
memory in each loom ASIC is functioning correctly by checking the following:
v
The built-in-self-repair (BISR) circuit in each loom chip does not report a failure to
repair bad cells (
bisr
test).
v
The data cells are uniquely written and then read correctly (
data write/read
test).
v
The data in any one ASIC is read from any other ASIC (
loom connection
test).
v
Bad parity is detected and flagged in the error register and posts an interrupt
(
parity error
test).
v
Buffer number errors are detected and flagged in the error register and post an
interrupt (
buffer number error
test).
v
Chip number errors are detected and flagged in the error register and post an
interrupt (
chip number error
test).
Pressing Enter while
centralMemoryTest
is selected displays a reminder to take
the switch offline, if it is not offline. If the message is displayed, take the switch
offline.
centralMemoryTest example:
The
centralMemoryTest
command performs a bit
write and read test of the ASIC central memory.
Table 30. centralMemoryTest example
Synopsis
centralMemoryTest [passCount, dataType, dataSeed]
Availability
Administrator
Description
Use this command to verify the address and data bus of the ASIC
SRAMs that serve as the central memory.
Below are possible error messages if failures are detected:
DIAG-TIMEOUT
DIAG-BADINT
DIAG-CMERRTYPE
DIAG-CMERRPTN
Operands
This command has the following operands. If all are omitted, the default
values used are 1 for passCount, QUAD_RAMP for dataType, and a
random value for dataSeed.
passCount
The number of times to execute this test.
dataType
The data type to use when writing the central memory.
The
dataTypeShow
command lists data types
allowed.
dataSeed
The initial seed value used in generating the data
pattern. For example, a QUAD_RAMP pattern with a
seed value of 0xdead is as follows: 0xdead, 0xdeae,
0xdeaf, 0xdeb0, ...
Some data types, such as BYTE_LFSR, do not require
a seed value.
Appendix B. Diagnostics
95
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