Intel 521 Data Sheet - Page 33

Die Voltage Validation

Page 33 highlights

Electrical Specifications 2.12 VCC Overshoot Specification The Pentium 4 processor in the 775-land package can tolerate short transient overshoot events where VCC exceeds the VID voltage when transitioning from a high to low current load condition. This overshoot cannot exceed VID + VOS_MAX (VOS_MAX is the maximum allowable overshoot voltage). The time duration of the overshoot event must not exceed TOS_MAX (TOS_MAX is the maximum allowable time duration above VID). These specifications apply to the processor die voltage as measured across the VCC_SENSE and VSS_SENSE lands. Table 2-17. VCC Overshoot Specifications Symbol Parameter Min Typ Max VOS_MAX Magnitude of VCC overshoot above VID - TOS_MAX Time duration of VCC overshoot above VID - - 0.050 - 25 Unit Figure V 2-4 µs 2-4 Figure 2-4. VCC Overshoot Example Waveform Example Overshoot Waveform VID + 0.050 V OS VID Voltage (V) T OS 2.12.1 Time T : Overshoot time above VID OS V : Overshoot above VID OS NOTES: 1. VOS is measured overshoot voltage. 2. TOS is measured time duration above VID. Die Voltage Validation Overshoot events from application testing on real processors must meet the specifications in Table 2-17 when measured across the VCC_SENSE and VSS_SENSE lands. Overshoot events that are < 10 ns in duration may be ignored. These measurements of processor die level overshoot should be taken with a 100 MHz bandwidth limited oscilloscope. Refer to the Voltage Regulator Down (VRD) 10.1 Design Guide For Desktop LGA775 Socket for additional voltage regulator validation details. Datasheet 33

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Datasheet
33
Electrical Specifications
2.12
V
CC
Overshoot Specification
The Pentium 4 processor in the 775-land package can tolerate short transient overshoot events
where V
CC
exceeds the VID voltage when transitioning from a high to low current load condition.
This overshoot cannot exceed VID + V
OS
_
MAX
(V
OS
_
MAX
is the maximum allowable overshoot
voltage). The time duration of the overshoot event must not exceed T
OS
_
MAX
(T
OS
_
MAX
is the
maximum allowable time duration above VID). These specifications apply to the processor die
voltage as measured across the VCC_SENSE and VSS_SENSE lands.
NOTES:
1. V
OS
is measured overshoot voltage.
2. T
OS
is measured time duration above VID.
2.12.1
Die Voltage Validation
Overshoot events from application testing on real processors must meet the specifications in
Table 2-17
when measured across the VCC_SENSE and VSS_SENSE lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurements of processor die level overshoot
should be taken with a 100 MHz bandwidth limited oscilloscope. Refer to the
Voltage Regulator
Down (VRD) 10.1 Design Guide For Desktop LGA775 Socket
for additional voltage regulator
validation details.
Table 2-17. V
CC
Overshoot Specifications
Symbol
Parameter
Min
Typ
Max
Unit
Figure
V
OS
_
MAX
Magnitude of V
CC
overshoot above VID
0.050
V
2-4
T
OS
_
MAX
Time duration of V
CC
overshoot above VID
25
µ
s
2-4
Figure 2-4. V
CC
Overshoot Example Waveform
Time
Example Overshoot Waveform
Voltage (V)
VID
VID + 0.050
T
OS
V
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID