Fujitsu MPD3173AT Product Manual - Page 117

Key-failure prediction status 4Fh-F4h

Page 117 highlights

Alternative, the device must issue the SMART Enable-Disable Attribute AutoSave subcommand (FR register = D2h) to use a feature which regularly save the device attribute value data to a medium. The host can predict failures in the device by periodically issuing the SMART Return Status subcommand (FR register = DAh) to reference the CL and CH registers. If an attribute value is below the insurance failure threshold value, the device is about to fail or the device is nearing the end of it life . In this case, the host recommends that the user quickly backs up the data. At command issuance (I-O registers setting contents) 1F7H(CM) 1 0 1 1 0 0 0 0 1F6H(DH) × × × DV xx 1F5H(CH) 1F4H(CL) 1F3H(SN) 1F2H(SC) 1F1H(FR) Key (C2h) Key (4Fh) xx xx Subcommand At command completion (I-O registers setting contents) 1F7H(ST) Status information 1F6H(DH) × × × DV xx 1F5H(CH) 1F4H(CL) 1F3H(SN) 1F2H(SC) 1F1H(ER) Key-failure prediction status (C2h-2Ch) Key-failure prediction status (4Fh-F4h) xx xx Error information 5 - 50 C141-E069-02EN

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C141-E069-02EN
5 - 50
Alternative, the device must issue the SMART Enable-Disable Attribute AutoSave
subcommand (FR register = D2h) to use a feature which regularly save the device attribute
value data to a medium.
The host can predict failures in the device by periodically issuing the SMART Return Status
subcommand (FR register = DAh) to reference the CL and CH registers.
If an attribute value is below the insurance failure threshold value, the device is about to fail or
the device is nearing the end of it life .
In this case, the host recommends that the user quickly
backs up the data.
At command issuance (I-O registers setting contents)
1F7
H
(CM)
1
0
1
1
0
0
0
0
1F6
H
(DH)
×
×
×
DV
xx
1F5
H
(CH)
1F4
H
(CL)
1F3
H
(SN)
1F2
H
(SC)
1F1
H
(FR)
Key (C2h)
Key (4Fh)
xx
xx
Subcommand
At command completion (I-O registers setting contents)
1F7
H
(ST)
Status information
1F6
H
(DH)
×
×
×
DV
xx
1F5
H
(CH)
1F4
H
(CL)
1F3
H
(SN)
1F2
H
(SC)
1F1
H
(ER)
Key-failure prediction status (C2h-2Ch)
Key-failure prediction status (4Fh-F4h)
xx
xx
Error information