HP T5125 Troubleshooting Guide - HP Compaq t5000 Series Thin Client, 8th Editi - Page 33

Power-On Diagnostic Tests

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Diagnostics and Troubleshooting Power-On Diagnostic Tests The Power-on diagnostics performs basic integrity tests of the hardware to determine its functionality and configuration. If a diagnostic test fails during hardware initialization the unit simply stops. There are no messages sent to video. ✎ You may try to restart the unit and run through the diagnostic tests a second time to confirm the first shutdown. The following table lists the tests that are performed on the t5000 units. Power-On Diagnostic Test Test Description Boot Block Checksum Tests boot block code for proper checksum value DRAM Simple write/read pattern test of the first 640k of memory Parallel port Initiates the port's driver and determines if the device is present Serial port Tests the serial port using simple port verification test to determine if ports are present Timer Tests timer interrupt by using polling method RTC CMOS battery Tests integrity of RTC CMOS battery NAND Flash device Tests for proper NAND flash device ID present Troubleshooting Guide www.hp.com 4-3

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Troubleshooting Guide
www.hp.com
4-3
Diagnostics and Troubleshooting
Power-On Diagnostic Tests
The Power-on diagnostics performs basic integrity tests of the
hardware to determine its functionality and configuration. If a
diagnostic test fails during hardware initialization the unit simply
stops. There are no messages sent to video.
✎
You may try to restart the unit and run through the diagnostic tests a
second time to confirm the first shutdown.
The following table lists the tests that are performed on the t5000
units.
Power-On Diagnostic Test
Test
Description
Boot Block Checksum
Tests boot block code for proper
checksum value
DRAM
Simple write/read pattern test of
the first 640k of memory
Parallel port
Initiates the port’s driver and
determines if the device is
present
Serial port
Tests the serial port using simple
port verification test to determine
if ports are present
Timer
Tests timer interrupt by using
polling method
RTC CMOS battery
Tests integrity of RTC CMOS
battery
NAND Flash device
Tests for proper NAND flash
device ID present