Lenovo PC 300PL User guide for IBM PC300PL (type 6584, 6594) systems - Page 129

Device troubleshooting charts

Page 129 highlights

If the following beep codes occur, have the computer serviced. Beep code 1-1-3 1-1-4 1-2-1 1-2-2 1-2-3 1-2-4 1-3-1 1-3-2 2-1-1 2-1-2 2-1-3 2-1-4 2-2-2 2-3-2 2-3-3 3-1-1 3-1-2 3-1-4 3-2-4 3-3-1 Probable cause CMOS write/read failure BIOS ROM checksum failure Programmable interval-timer test failure DMA initialization failure DMA page register write/read test failure RAM refresh verification failure Memory failure or too many devices on RIMMs First 64 Kb RAM parity test failure Secondary DMA register test in progress or failure Primary DMA register test in progress or failure Primary interrupt mask register test failure Secondary interrupt mask register test failure Keyboard controller test failure Screen memory test in progress or failure Screen retrace tests in progress or failure Timer tick interrupt test failure Interval timer channel 2 test failure Time-of-day clock test failure Comparing CMOS memsize against actual Memory size mismatch occurred Device troubleshooting charts You can use the troubleshooting charts in this section to find solutions to problems that have definite symptoms. Important If you find it necessary to remove the computer cover, first read "Safety information" on page vii and "Removing the cover" on page 61 (desktop) or "Removing the cover" on page 77 (tower) for important safety information and instructions. Chapter 6. Troubleshooting 115

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If the following beep codes occur, have the computer serviced.
Device troubleshooting charts
You can use the troubleshooting charts in this section to find solutions to
problems that have definite symptoms.
Important
If you find it necessary to remove the computer cover, first read “Safety
information” on page
vii and “Removing the cover” on page
61
(desktop) or “Removing the cover” on page
77 (tower) for important
safety information and instructions.
Beep code
Probable cause
1–1–3
CMOS write/read failure
1–1–4
BIOS ROM checksum failure
1–2–1
Programmable interval-timer test failure
1–2–2
DMA initialization failure
1–2–3
DMA page register write/read test failure
1–2–4
RAM refresh verification failure
1–3–1
Memory failure or too many devices on RIMMs
1–3–2
First 64 Kb RAM parity test failure
2–1–1
Secondary DMA register test in progress or failure
2–1–2
Primary DMA register test in progress or failure
2–1–3
Primary interrupt mask register test failure
2–1–4
Secondary interrupt mask register test failure
2–2–2
Keyboard controller test failure
2–3–2
Screen memory test in progress or failure
2–3–3
Screen retrace tests in progress or failure
3–1–1
Timer tick interrupt test failure
3–1–2
Interval timer channel 2 test failure
3–1–4
Time-of-day clock test failure
3–2–4
Comparing CMOS memsize against actual
3–3–1
Memory size mismatch occurred
Chapter 6.
Troubleshooting
115