HP StorageWorks MSA2012i HP StorageWorks 2000 Modular Smart Array Reference Gu - Page 201
The number of SMART Self-Monitoring Analysis and, Bad Block List Size
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4. Note any error counts displayed for these statistics. Field Description SMART Event Count The number of SMART (Self-Monitoring Analysis and Reporting Technology) events that the drive recorded. These events are often used by the vendor to determine the root cause of a drive failure. Some SMART events may indicate imminent electromechanical failure. I/O Timeout Count The number of times the drive accepted an I/O request but did not complete it in the required amount of time. Excessive timeouts can indicate potential device failure (media retries or soft, recoverable errors) No Response Count The number of times the drive failed to respond to an I/O request. A high value can indicate that the drive is too busy to respond to further requests. Spin-up Retries The number of times the drive failed to start on power-up or on a software request. Excessive spin-up retries can indicate that a drive is close to failing. Media Errors The number of times the drive had to retry an I/O operation because the media did not successfully record/retrieve the data correctly. Non Media Errors The number of soft, recoverable errors that are not associated with drive media. Bad Block Reassignments The number of block reassignments that have taken place since the drive was shipped from the vendor. A large number of reallocations in a short period of time could indicate a serious condition. Bad Block List Size The number of blocks that have been deemed defective either from the vendor or over time due to reallocation. Chapter 7 Troubleshooting Using SMU 201
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