AMD AMD-K6-2/400 User Guide - Page 155
TCK (Test Clock), 5.47 TDI (Test Data Input), Pin Attribute, Summary, Sampled, Driven and Floated
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23542A/0-September 2000 Preliminary Information AMD-K6™-2E+ Embedded Processor Data Sheet 5.46 TCK (Test Clock) Pin Attribute Summary Sampled Input, Internal Pullup TCK is the clock for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 253 for details regarding the operation of the TAP controller. The processor always samples TCK, except while TRST# is asserted. 5.47 TDI (Test Data Input) Pin Attribute Summary Input, Internal Pullup TDI is the serial test data and instruction input for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 253 for details regarding the operation of the TAP controller. Sampled The processor samples TDI on every rising TCK edge, but only while in the Shift-IR and Shift-DR states. 5.48 TDO (Test Data Output) Pin Attribute Output Summary TDO is the serial test data and instruction output for boundary-scan testing using the Test Access Port (TAP). See "Boundary-Scan Test Access Port (TAP)" on page 253 for details regarding the operation of the TAP controller. Driven and Floated The processor drives TDO on every falling TCK edge, but only while in the Shift-IR and Shift-DR states. TDO is floated at all other times. Chapter 5 Signal Descriptions 133