AMD AMD-K6-2/400 User Guide - Page 282
TAP Controller State, Machine, EXTEST Instruction., SAMPLE/PRELOAD Instruction., IDCODE Instruction.
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Preliminary Information AMD-K6™-2E+ Embedded Processor Data Sheet 23542A/0-September 2000 TAP Controller State Machine EXTEST Instruction. When the EXTEST instruction is executed, the processor loads the BSR shift register with the current state of the input and bidirectional pins in the Capture-DR state and drives the output and bidirectional pins with the corresponding values from the BSR output register in the Update-DR state. SAMPLE/PRELOAD Instruction. The SAMPLE/PRELOAD instruction performs two functions. These functions are as follows: s During the Capture-DR state, the processor loads the BSR shift register with the current state of every input, output, and bidirectional pin. s During the Update-DR state, the BSR output register is loaded from the BSR shift register in preparation for the next EXTEST instruction. The SAMPLE/PRELOAD instruction does not affect the normal operational state of the processor. BYPASS Instruction. The BYPASS instruction selects the BR register, which reduces the boundary-scan length through the processor from 297 to one (TDI to BR to TDO). The BYPASS instruction does not affect the normal operational state of the processor. IDCODE Instruction. The IDCODE instruction selects the DIR register, allowing the device identification code to be shifted out of the processor. This instruction is loaded into the IR when the TAP controller is reset. The IDCODE instruction does not affect the normal operational state of the processor. HIGHZ Instruction. The HIGHZ instruction forces all output and bidirectional pins to be floated. During this instruction, the BR is selected and the normal operational state of the processor is not affected. The TAP controller state diagram is shown in Figure 90 on page 261. State transitions occur on the rising edge of TCK. The logic 0 or 1 next to the states represents the value of the TMS signal sampled by the processor on the rising edge of TCK. 260 Test and Debug Chapter 13