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AMD AMD-K6-2/400 User Guide - Page 275

BoundaryScan Test Access Port (TAP), Test Access Port TAP Controller, Instruction Register IR

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23542A/0-September 2000 Preliminary Information AMD-K6™-2E+ Embedded Processor Data Sheet s TDO is never floated because the Boundary-Scan Test Access Port must remain enabled at all times, including during the Three-State Test mode. The Three-State Test mode is exited when the processor samples RESET asserted. 13.3 Boundary-Scan Test Access Port (TAP) The boundary-scan Test Access Port (TAP) is an IEEE standard that defines synchronous scanning test methods for complex logic circuits, such as boards containing a processor. The AMD-K6-2E+ processor supports the TAP standard defined in the IEEE Standard Test Access Port and Boundary-Scan Architecture (IEEE 1149.1-1990) specification. Test Access Port Boundary scan testing uses a shift register consisting of the serial interconnection of boundary-scan cells that correspond to each I/O buffer of the processor. This non-inverting register chain, called a Boundary Scan Register (BSR), can be used to capture the state of every processor pin and to drive every processor output and bidirectional pin to a known state. Each BSR of every component on a board that implements the boundary-scan architecture can be serially interconnected to enable component interconnect testing. The TAP consists of the following: s Test Access Port (TAP) Controller-The TAP controller is a synchronous, finite state machine that uses the TMS and TDI input signals to control a sequence of test operations. See "TAP Controller State Machine" on page 260 for a list of TAP states and their definition. s Instruction Register (IR)-The IR contains the instructions that select the test operation to be performed and the Test Data Register (TDR) to be selected. See "TAP Registers" on page 255 for more details on the IR. s Test Data Registers (TDR)-The three TDRs are used to process the test data. Each TDR is selected by an instruction in the Instruction Register (IR). See "TAP Registers" on page 255 for a list of these registers and their functions. Chapter 13 Test and Debug 253

Section	Page
IF YOU HAVE QUESTIONS, WE\	3
Contents	5
List of Figures	9
List of Tables	13
Revision History	17
About this Data Sheet	19
1 AMDK6™2E+ Embedded Processor	23
1.1 AMDK6™2E+ Embedded Processor Features	25
1.2 Process Technology	29
1.3 Super7™ Platform	30
2 Internal Architecture	33
2.1 Microarchitecture Overview	33
2.2 Cache, Instruction Prefetch, and Predecode Bits	38
2.3 Instruction Fetch and Decode	39
2.4 Centralized Scheduler	43
2.5 Execution Units	44
2.6 BranchPrediction Logic	47
3 Software Environment	49
3.1 Registers	49
3.2 ModelSpecific Registers (MSR)	66
3.3 Memory Management Registers	76
3.4 Paging	78
3.5 Descriptors and Gates	81
3.6 Exceptions and Interrupts	84
3.7 Instructions Supported by the AMDK6™2E+ Processor	85
4 Logic Symbol Diagram	113
5 Signal Descriptions	115
5.1 Signal Terminology	115
5.2 A20M# (Address Bit 20 Mask)	116
5.3 A[31:3] (Address Bus)	117
5.4 ADS# (Address Strobe)	118
5.5 ADSC# (Address Strobe Copy)	118
5.6 AHOLD (Address Hold)	119
5.7 AP (Address Parity)	120
5.8 APCHK# (Address Parity Check)	121
5.9 BE[7:0]# (Byte Enables)	122
5.10 BF[2:0] (Bus Frequency)	123
5.11 BOFF# (Backoff)	124
5.12 BRDY# (Burst Ready)	125
5.13 BRDYC# (Burst Ready Copy)	126
5.14 BREQ (Bus Request)	126
5.15 CACHE# (Cacheable Access)	127
5.16 CLK (Clock)	127
5.17 D/C# (Data/Code)	128
5.18 D[63:0] (Data Bus)	129
5.19 DP[7:0] (Data Parity)	130
5.20 EADS# (External Address Strobe)	131
5.21 EWBE# (External Write Buffer Empty)	132
5.22 FERR# (FloatingPoint Error)	133
5.23 FLUSH# (Cache Flush)	134
5.24 HIT# (Inquire Cycle Hit)	135
5.25 HITM# (Inquire Cycle Hit To Modified Line)	135
5.26 HLDA (Hold Acknowledge)	136
5.27 HOLD (Bus Hold Request)	137
5.28 IGNNE# (Ignore Numeric Exception)	138
5.29 INIT (Initialization)	139
5.30 INTR (Maskable Interrupt)	140
5.31 INV (Invalidation Request)	140
5.32 KEN# (Cache Enable)	141
5.33 LOCK# (Bus Lock)	142
5.34 M/IO# (Memory or I/O)	143
5.35 NA# (Next Address)	144
5.36 NMI (NonMaskable Interrupt)	145
5.37 PCD (Page Cache Disable)	146
5.38 PCHK# (Parity Check)	147
5.39 PWT (Page Writethrough)	148
5.40 RESET (Reset)	149
5.41 RSVD (Reserved)	150
5.42 SCYC (Split Cycle)	151
5.43 SMI# (System Management Interrupt)	152
5.44 SMIACT# (System Management Interrupt Active)	153
5.45 STPCLK# (Stop Clock)	154
5.46 TCK (Test Clock)	155
5.47 TDI (Test Data Input)	155
5.48 TDO (Test Data Output)	155
5.49 TMS (Test Mode Select)	156
5.50 TRST# (Test Reset)	156
5.51 VCC2DET (VCC2 Detect)	157
5.52 VCC2H/L# (VCC2 High/Low)	158
5.53 VID[4:0] (Voltage Identification)	159
5.54 W/R# (Write/Read)	160
5.55 WB/WT# (Writeback or Writethrough)	161
5.56 Pin Tables by Type	162
5.57 Bus Cycle Definitions	164
6 AMD PowerNow!™ Technology	165
6.1 Enhanced Power Management Features	165
6.2 Dynamic Core Frequency and Core Voltage Control	172
7 Bus Cycles	175
7.1 Timing Diagrams	175
7.2 Bus States	177
7.3 Memory Reads and Writes	180
7.4 I/O Read and Write	188
7.5 Inquire and Bus Arbitration Cycles	190
7.6 Special Bus Cycles	212
8 Poweron Configuration and Initialization	221
8.1 Signals Sampled During the Falling Transition of RESET	221
8.2 RESET Requirements	222
8.3 State of Processor After RESET	222
8.4 State of Processor After INIT	225
9 Cache Organization	227
9.1 MESI States in the L1 Data Cache and L2 Cache	229
9.2 Predecode Bits	230
9.3 Cache Operation	230
9.4 Cache Disabling and Flushing	233
9.5 L2 Cache Testing	235
9.6 CacheLine Fills	235
9.7 CacheLine Replacements	236
9.8 Write Allocate	237
9.9 Prefetching	242
9.10 Cache States	243
9.11 Cache Coherency	244
9.12 Writethrough and Writeback Coherency States	249
9.13 A20M# Masking of Cache Accesses	249
10 Write Merge Buffer	251
10.1 EWBE# Control	251
10.2 Memory Type Range Registers	253
10.3 Memory-Range Restrictions	255
10.4 Examples	257
11 FloatingPoint and Multimedia Execution Units	259
11.1 FloatingPoint Execution Unit	259
11.2 Multimedia and 3DNow!™ Execution Units	261
11.3 FloatingPoint and MMX™/3DNow!™ Instruction Compatibility	262
12 System Management Mode (SMM)	263
12.1 SMM Operating Mode and Default Register Values	263
12.2 SMM StateSave Area	265
12.3 SMM Revision Identifier	267
12.4 SMM Base Address	268
12.5 Halt Restart Slot	268
12.6 I/O Trap Doubleword	269
12.7 I/O Trap Restart Slot	270
12.8 Exceptions, Interrupts, and Debug in SMM	272
13 Test and Debug	273
13.1 BuiltIn SelfTest (BIST)	273
13.2 ThreeState Test Mode	274
13.3 BoundaryScan Test Access Port (TAP)	275
13.4 Cache Inhibit	285
13.5 L2 Cache and Tag Array Testing	286
13.6 Debug	290
14 Clock Control	297
14.1 Clock Control States	297
14.2 Halt State	300
14.3 Stop Grant State	300
14.4 Stop Grant Inquire State	302
14.5 EPM Stop Grant State	303
14.6 Stop Clock State	305
15 Electrical Data	307
15.1 Operating Ranges	308
15.2 Absolute Ratings	309
15.3 DC Characteristics	309
15.4 Power Dissipation	311
15.5 Power and Grounding	313
16 Signal Switching Characteristics	317
16.1 CLK Switching Characteristics	318
16.2 Clock Switching Characteristics for 100MHz Bus Operation	318
16.3 Clock Switching Characteristics for 66MHz Bus Operation	319
16.4 Valid Delay, Float, Setup, and Hold Timings	320
16.5 Output Delay Timings for 100MHz Bus Operation	320
16.6 Input Setup and Hold Timings for 100MHz Bus Operation	322
16.7 Output Delay Timings for 66MHz Bus Operation	324
16.8 Input Setup and Hold Timings for 66MHz Bus Operation	326
16.9 RESET and Test Signal Timing	328
16.10 Timing Diagrams	331
17 Thermal Design	335
17.1 Package Thermal Specifications	335
17.2 Measuring Case Temperature	339
17.3 Layout and Airflow Considerations	339
18 Pin Designations	343
18.1 Pins Designations for CPGA Package	344
18.2 Pins Designations for OBGA Package	348
19 Package Specifications	353
19.1 321Pin Staggered CPGA Package Specification	353
19.2 349Ball OBGA Package Specification	354
20 Ordering Information	355

Match case Limit results 1 per page

Chapter 13

Test and Debug

253

23542A/0—September 2000

AMD-K6™-2E+ Embedded Processor Data Sheet

Preliminary Information

■

TDO is never floated because the Boundary-Scan Test

Access Port must remain enabled at all times, including

during the Three-State Test mode.

The Three-State Test mode is exited when the processor

samples RESET asserted.

13.3

Boundary-Scan Test Access Port (TAP)

The boundary-scan Test Access Port (TAP) is an IEEE standard

that defines synchronous scanning test methods for complex

logic circuits, such as boards containing a processor. The

AMD-K6-2E+ processor supports the TAP standard defined in

the

IEEE Standard Test Access Port and Boundary-Scan

Architecture (IEEE 1149.1-1990)

specification.

Boundary scan testing uses a shift register consisting of the

serial interconnection of boundary-scan cells that correspond to

each I/O buffer of the processor. This non-inverting register

chain, called a Boundary Scan Register (BSR), can be used to

capture the state of every processor pin and to drive every

processor output and bidirectional pin to a known state.

Each BSR of every component on a board that implements the

boundary-scan architecture can be serially interconnected to

enable component interconnect testing.

Test Access Port

The TAP consists of the following:

■

Test Access Port (TAP) Controller

—The TAP controller is a

synchronous, finite state machine that uses the TMS and

TDI input signals to control a sequence of test operations.

See “TAP Controller State Machine” on page 260 for a list of

TAP states and their definition.

■

Instruction Register (IR)

—The IR contains the instructions

that select the test operation to be performed and the Test

Data Register (TDR) to be selected. See “TAP Registers” on

page 255 for more details on the IR.

■

Test Data Registers (TDR)

—The three TDRs are used to

process the test data. Each TDR is selected by an instruction

in the Instruction Register (IR). See “TAP Registers” on

page 255 for a list of these registers and their functions.

AMD AMD-K6-2/400 User Guide - Page 275

BoundaryScan Test Access Port (TAP), Test Access Port TAP Controller, Instruction Register IR

Page 275 highlights

BoundaryScan Test Access Port (TAP), Test Access Port TAP Controller, Instruction Register IR