Lexmark T632 Service Manual - Page 137

SDRAM Memory Test, Parallel Wrap Test, Return/Stop

Page 137 highlights

4060-xxx SDRAM Memory Test The purpose of this test is to check the validity of SDRAM, both standard and optional. The test writes patterns of data to SDRAM to verify that each bit in memory can be set and read correctly. To run the SDRAM Memory Test: 1. Select SDRAM Memory Test from the menu. The power indicator blinks indicating the test is in progress. 2. Press Return/Stop to exit the test. P:###### represents the number of times the memory test has passed and finished successfully. Initially 000000 displays with the maximum pass count being 999,999. F:##### represents the number of times the memory test has failed and finished with errors. Initially 00000 displays with the maximum fail count being 99,999. Once the maximum pass count or fail count is reached, the test is stopped, the power indicator is turned on solid, and the final results display. If the test fails, the message SDRAM Error, displays for approximately three seconds and the failure count increases by 1. ROM Memory Test The ROM Memory Test is used to check the validity of the controller board code and fonts. To run the ROM Memory Test: 1. Select ROM Memory Test from the menu. P and F represent the same numbers for DRAM. The power indicator blinks indicating the test is in process. The test runs continuously. Each time the test finishes, the screen updates with the result. If the test passes, the Pass Count increases by 1, however if the test fails, one of the following messages displays for approximately three seconds: ROM Checksum Error or ROM Burst Read Error. Once the maximum pass count or fail count is reached, the test stops with the power indicator on solid. The results appear on the screen. 2. Press Return/Stop to exit the test. Parallel Wrap Test This test is used with a wrap plug to check operation of the parallel port hardware. Each parallel signal is tested. To run the Parallel Wrap Test: 1. Disconnect the parallel interface cable and install the wrap plug (P/N 1319128). 2. Select Parallel Wrap Test from the menu. The power indicator blinks indicating the test is in progress. The test runs continuously until canceled. Each time the test finishes, the screen updates. If the test passes, the Pass Count increases by 1, however if the test fails, a message displays for approximately three seconds. Once the maximum count is reached the test stops. The power indicator goes on solid and the final results display. 3. Press Return/Stop to exit the test. Diagnostic aids 3-9

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Diagnostic aids
3-9
4060-
xxx
SDRAM Memory Test
The purpose of this test is to check the validity of SDRAM, both standard and optional. The test
writes patterns of data to SDRAM to verify that each bit in memory can be set and read correctly.
To run the SDRAM Memory Test:
1.
Select
SDRAM Memory Test
from the menu. The power indicator blinks indicating the test is in
progress.
2.
Press
Return/Stop
to exit the test.
P:
######
represents the number of times the memory test has passed and finished successfully.
Initially 000000 displays with the maximum pass count being 999,999.
F:
#####
represents the number of times the memory test has failed and finished with errors. Initially
00000 displays with the maximum fail count being 99,999.
Once the maximum pass count or fail count is reached, the test is stopped, the power indicator is
turned on solid, and the final results display. If the test fails, the message SDRAM Error, displays for
approximately three seconds and the failure count increases by 1.
ROM Memory Test
The ROM Memory Test is used to check the validity of the controller board code and fonts.
To run the ROM Memory Test:
1.
Select
ROM Memory Test
from the menu. P and F represent the same numbers for DRAM. The
power indicator blinks indicating the test is in process. The test runs continuously.
Each time the test finishes, the screen updates with the result. If the test passes, the Pass
Count increases by 1, however if the test fails, one of the following messages displays for
approximately three seconds: ROM Checksum Error or ROM Burst Read Error. Once the
maximum pass count or fail count is reached, the test stops with the power indicator on solid.
The results appear on the screen.
2.
Press
Return/Stop
to exit the test.
Parallel Wrap Test
This test is used with a wrap plug to check operation of the parallel port hardware. Each parallel
signal is tested.
To run the Parallel Wrap Test:
1.
Disconnect the parallel interface cable and install the wrap plug (P/N 1319128).
2.
Select
Parallel Wrap Test
from the menu. The power indicator blinks indicating the test is in
progress. The test runs continuously until canceled.
Each time the test finishes, the screen updates. If the test passes, the Pass Count increases
by 1, however if the test fails, a message displays for approximately three seconds. Once the
maximum count is reached the test stops. The power indicator goes on solid and the final results
display.
3.
Press
Return/Stop
to exit the test.