Dell Broadcom NetXtreme Family of Adapters Broadcom NetXtreme 57XX User Guide - Page 127

Diagnostic Test Messages

Page 127 highlights

C3 DMA C4 MII C5 VPD This test tests both high-priority direct memory access (DMA) and low-priority DMA. The test moves data from the host memory to the adapter SRAM and verifies the data. The test then moves data back to the host memory to again verify the data. The medium independent interface (MII) test function is identical to that of the Control Register Test (A2). Each register specified in the configuration contents defines the read-only and read/write bits. The test writes 0s and 1s to the test bits to ensure that the read-only bit values are not changed and that the read/write bits are changed. The test attempts to read the register configuration file (Miireg.txt) for the register definitions. If the file does not exist, the following table is used: Offset Read-Only Mask Read/Write Mask 0x00 0x0000 0x7180 0x02 0xFFFF 0x0000 0x03 0xFFFF 0x0000 0x04 0x0000 0xFFFF 0x05 0xEFFF 0x0000 0x06 0x0001 0x0000 0x07 0x0800 0xB7FF 0x08 0xFFFF 0x0000 0x09 0x0000 0xFF00 0x0A 0x7C00 0x0000 0x10 0x0000 0xFFBF 0x11 0x7C00 0x0000 0x19 0x7C00 0x0000 0x1E 0x0000 0xFFFF 0x1F 0x0000 0xFFFF The VPD test first saves the contents of the vital product data (VPD) memory before performing the test. The test then writes 1 of the 5 test data patterns (0xFF, 0xAA, 0x55, increment data, or decrement data) into VPD memory. By default, an incremental data pattern is used. The test writes and reads back the data for the entire test range, and then restores the original contents of the VPD memory. Reset Test. This test sets the reset bit and polls for self-clearing bits. This test verifies the reset value of the registers. Event Mapping Test. This test sets the SMB_ATTN bit. By changing ASF_ATTN_ LOC bits, the test verifies the mapping bits in TX_CPU or RX_CPU event bits. Counter Test C6 ASF Hardware Clears WG_TO, HB_TO, PA_TO, PL_TO, RT_TO bits (by setting the bits) and ensures that the bits clear. Clears the timestamp counter. Writes a 1 to each of the PL, PA, HB, WG, RT counters. Sets the TSC_EN bit. Polls each PA_TO bit and counts up to 50. Checks if the PL_TO bit is set at the end of the count to 50. Continues to count up to 200. Checks if all other TO bits are set and verifies if the timestamp counter is incremented. C7 Expansion ROM This test tests the ability to enable, disable, and access the expansion read-only memory (ROM) on the adapter. C8 CPU Fetch This test tests the PCU instruction fetch logic 100 times. Group D: Driver Associated Tests This test is an internal loopback data transmit/receive test. It initializes the medium access control D1 MAC Loopback (MAC) into an internal loopback mode and transmits 100 packets. The data should be routed back to the receive channel and received by the receive routine, which verifies the integrity of data. A 100-Mbit/s data rate is used for this test unless Gigabit Ethernet is enabled. D2 PHY Loopback This test is same as the MAC loopback test (D1), except that the data is routed back via a physical layer device (PHY). A 100-Mbit/s data rate is used for this test unless Gigabit Ethernet is enabled. D5 MII Miscellaneous This test tests the autopolling and PHY interrupt capabilities. These are functions of the PHY. D6 MSI This test tests the message signal interrupt (MSI) capability of the adapter. Refer to PCI Specification, version 2.3, for the MSI definition. Diagnostic Test Messages /* 0 */ "PASS", /* 1 */ "Got 0x%08X @ 0x%08X. Expected 0x%08X", /* 2 */ "Cannot perform task while chip is running", /* 3 */ "Invalid NIC device", /* 4 */ "Read-only bit %s got changed after writing zero at offset 0x%X",

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C3
DMA
This test tests both high-priority direct memory access (DMA) and low-priority DMA. The test moves
data from the host memory to the adapter SRAM and verifies the data. The test then moves data
back to the host memory to again verify the data.
C4
MII
The medium independent interface (MII) test function is identical to that of the Control Register
Test (A2). Each register specified in the configuration contents defines the read-only and read/write
bits. The test writes 0s and 1s to the test bits to ensure that the read-only bit values are not
changed and that the read/write bits are changed.
The test attempts to read the register configuration file (Miireg.txt) for the register definitions. If the
file does not exist, the following table is used:
Offset
Read-Only Mask
Read/Write Mask
0x00
0x0000
0x7180
0x02
0xFFFF
0x0000
0x03
0xFFFF
0x0000
0x04
0x0000
0xFFFF
0x05
0xEFFF
0x0000
0x06
0x0001
0x0000
0x07
0x0800
0xB7FF
0x08
0xFFFF
0x0000
0x09
0x0000
0xFF00
0x0A
0x7C00
0x0000
0x10
0x0000
0xFFBF
0x11
0x7C00
0x0000
0x19
0x7C00
0x0000
0x1E
0x0000
0xFFFF
0x1F
0x0000
0xFFFF
C5
VPD
The VPD test first saves the contents of the vital product data (VPD) memory before performing the
test. The test then writes 1 of the 5 test data patterns (0xFF, 0xAA, 0x55, increment data, or
decrement data) into VPD memory. By default, an incremental data pattern is used. The test writes
and reads back the data for the entire test range, and then restores the original contents of the
VPD memory.
C6
ASF
Hardware
Reset Test.
This test sets the reset bit and polls for self-clearing bits. This test verifies the reset
value of the registers.
Event Mapping Test.
This test sets the SMB_ATTN bit. By changing ASF_ATTN_ LOC bits, the test
verifies the mapping bits in TX_CPU or RX_CPU event bits.
Counter Test
Clears WG_TO, HB_TO, PA_TO, PL_TO, RT_TO bits (by setting the bits) and ensures that the
bits clear.
Clears the timestamp counter. Writes a 1 to each of the PL, PA, HB, WG, RT counters. Sets
the TSC_EN bit.
Polls each PA_TO bit and counts up to 50. Checks if the PL_TO bit is set at the end of the
count to 50. Continues to count up to 200. Checks if all other TO bits are set and verifies if
the timestamp counter is incremented.
C7
Expansion
ROM
This test tests the ability to enable, disable, and access the expansion read-only memory (ROM) on
the adapter.
C8
CPU Fetch
This test tests the PCU instruction fetch logic 100 times.
Group D: Driver Associated Tests
D1
MAC
Loopback
This test is an internal loopback data transmit/receive test. It initializes the medium access control
(MAC) into an internal loopback mode and transmits 100 packets. The data should be routed back
to the receive channel and received by the receive routine, which verifies the integrity of data. A
100-Mbit/s data rate is used for this test unless Gigabit Ethernet is enabled.
D2
PHY
Loopback
This test is same as the MAC loopback test (D1), except that the data is routed back via a physical
layer device (PHY). A 100-Mbit/s data rate is used for this test unless Gigabit Ethernet is enabled.
D5
MII
Miscellaneous
This test tests the autopolling and PHY interrupt capabilities. These are functions of the PHY.
D6
MSI
This test tests the message signal interrupt (MSI) capability of the adapter. Refer to PCI
Specification, version 2.3, for the MSI definition.
Diagnostic Test Messages
/* 0 */
"PASS",
/* 1 */
"Got 0x%08X @ 0x%08X. Expected 0x%08X",
/* 2 */
"Cannot perform task while chip is running",
/* 3 */
"Invalid NIC device",
/* 4 */
"Read-only bit %s got changed after writing zero
at offset 0x%X",