AMD AMD-K6-2/500AFX Data Sheet - Page 289

Valid Delay, Float, Setup, and Hold Timings, Signal Switching Characteristics, AMD-K6

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21850J/0-February 2000 Preliminary Information AMD-K6®-2 Processor Data Sheet t2 2.0 V 1.5 V 0.8 V t5 t3 t4 t1 Figure 95. CLK Waveform 16.4 Valid Delay, Float, Setup, and Hold Timings Valid delay and float timings are given for output signals during functional operation and are given relative to the rising edge of CLK. During boundary-scan testing, valid delay and float timings for output signals are with respect to the falling edge of TCK. The maximum valid delay timings are provided to allow a system designer to determine if setup times to the system logic can be met. Likewise, the minimum valid delay timings are used to analyze hold times to the system logic. The setup and hold time requirements for the AMD-K6-2 processor input signals must be met by the system logic to assure the proper operation of the AMD-K6-2 processor. The setup and hold timings during functional and boundary-scan test mode are given relative to the rising edge of CLK and TCK, respectively. Chapter 16 Signal Switching Characteristics 269

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Chapter 16
Signal Switching Characteristics
269
21850J/0—February 2000
AMD-K6
®
-2 Processor Data Sheet
Preliminary Information
Figure 95.
CLK Waveform
16.4
Valid Delay, Float, Setup, and Hold Timings
Valid delay and float timings are given for output signals during
functional operation and are given relative to the rising edge of
CLK. During boundary-scan testing, valid delay and float
timings for output signals are with respect to the falling edge of
TCK. The maximum valid delay timings are provided to allow a
system designer to determine if setup times to the system logic
can be met. Likewise, the minimum valid delay timings are used
to analyze hold times to the system logic.
The setup and hold time requirements for the AMD-K6-2
processor input signals must be met by the system logic to
assure the proper operation of the AMD-K6-2 processor. The
setup and hold timings during functional and boundary-scan
test mode are given relative to the rising edge of CLK and TCK,
respectively.
t
5
2.0 V
1.5 V
0.8 V
t
2
t
3
t
4
t
1